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Title: Fourier-transform analysis of normal photoelectron diffraction data for surface-structure determination

Abstract

A direct method for surface-structure determination from normal emission photoelectron diffraction (NPD) data is presented. Fourier transforms of the calculated NPD intensities yield peaks at adsorbate-substrate normal interlayer distances. Applications are demonstrated using theoretical NPD curves for the Se/Ni system calculated by dynamical theory. These results show that interplanar spacings between the overlayer and as many as four substrate layers could be determined with an accuracy of better than 2%.

Authors:
; ; ;
Publication Date:
Research Org.:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1082166
Report Number(s):
LBL-11686
Journal ID: ISSN 0027-8424
DOE Contract Number:  
AC02-05CH11231
Resource Type:
Journal Article
Journal Name:
Proceedings of the National Academy of Sciences of the United States of America
Additional Journal Information:
Journal Volume: 78; Journal Issue: 9; Journal ID: ISSN 0027-8424
Publisher:
National Academy of Sciences, Washington, DC (United States)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY

Citation Formats

Hussain, Z., Shirley, D. A., Li, C. H., and Tong, S. Y. Fourier-transform analysis of normal photoelectron diffraction data for surface-structure determination. United States: N. p., 1981. Web. doi:10.1073/pnas.78.9.5293.
Hussain, Z., Shirley, D. A., Li, C. H., & Tong, S. Y. Fourier-transform analysis of normal photoelectron diffraction data for surface-structure determination. United States. https://doi.org/10.1073/pnas.78.9.5293
Hussain, Z., Shirley, D. A., Li, C. H., and Tong, S. Y. 1981. "Fourier-transform analysis of normal photoelectron diffraction data for surface-structure determination". United States. https://doi.org/10.1073/pnas.78.9.5293. https://www.osti.gov/servlets/purl/1082166.
@article{osti_1082166,
title = {Fourier-transform analysis of normal photoelectron diffraction data for surface-structure determination},
author = {Hussain, Z. and Shirley, D. A. and Li, C. H. and Tong, S. Y.},
abstractNote = {A direct method for surface-structure determination from normal emission photoelectron diffraction (NPD) data is presented. Fourier transforms of the calculated NPD intensities yield peaks at adsorbate-substrate normal interlayer distances. Applications are demonstrated using theoretical NPD curves for the Se/Ni system calculated by dynamical theory. These results show that interplanar spacings between the overlayer and as many as four substrate layers could be determined with an accuracy of better than 2%.},
doi = {10.1073/pnas.78.9.5293},
url = {https://www.osti.gov/biblio/1082166}, journal = {Proceedings of the National Academy of Sciences of the United States of America},
issn = {0027-8424},
number = 9,
volume = 78,
place = {United States},
year = {Tue Sep 01 00:00:00 EDT 1981},
month = {Tue Sep 01 00:00:00 EDT 1981}
}