Thermal Reliability Study of Bypass Diodes in Photovoltaic Modules (Poster)
Conference
·
OSTI ID:1079736
This paper presents the result of high-temperature durability and thermal cycling testing and analysis for the selected diodes to study the detail of the thermal design and relative long-term reliability of the bypass diodes used to limit the detrimental effects of module hot-spot susceptibility.
- Research Organization:
- National Renewable Energy Lab. (NREL), Golden, CO (United States)
- Sponsoring Organization:
- USDOE Office of Energy Efficiency and Renewable Energy Solar Energy Technologies Program
- DOE Contract Number:
- AC36-08GO28308
- OSTI ID:
- 1079736
- Report Number(s):
- NREL/PO-5200-58225
- Resource Relation:
- Conference: Presented at the 2013 Photovoltaic Module Reliability Workshop, 26-27 February 2013, Golden, Colorado; Related Information: NREL (National Renewable Energy Laboratory)
- Country of Publication:
- United States
- Language:
- English
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