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Title: A method to detect retained gas during AC electrograining using in-situ small angle X-ray scattering

Authors:
; ; ; ; ; ; ;  [1];  [2];  [2]
  1. (Birmingham UK)
  2. (
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
Sponsoring Org.:
FOREIGN
OSTI Identifier:
1079079
Resource Type:
Journal Article
Journal Name:
Electrochem. Commun.
Additional Journal Information:
Journal Volume: 12; Journal Issue: (6) ; 06, 2010
Country of Publication:
United States
Language:
ENGLISH

Citation Formats

Hammons, J.A., Rayment, T., Vandendael, I., Blajiev, O., Hubin, A., Davenport, A.J., Raes, M., Terryn, H., DLS), and Vrije). A method to detect retained gas during AC electrograining using in-situ small angle X-ray scattering. United States: N. p., 2014. Web. doi:10.1016/j.elecom.2010.03.013.
Hammons, J.A., Rayment, T., Vandendael, I., Blajiev, O., Hubin, A., Davenport, A.J., Raes, M., Terryn, H., DLS), & Vrije). A method to detect retained gas during AC electrograining using in-situ small angle X-ray scattering. United States. doi:10.1016/j.elecom.2010.03.013.
Hammons, J.A., Rayment, T., Vandendael, I., Blajiev, O., Hubin, A., Davenport, A.J., Raes, M., Terryn, H., DLS), and Vrije). Wed . "A method to detect retained gas during AC electrograining using in-situ small angle X-ray scattering". United States. doi:10.1016/j.elecom.2010.03.013.
@article{osti_1079079,
title = {A method to detect retained gas during AC electrograining using in-situ small angle X-ray scattering},
author = {Hammons, J.A. and Rayment, T. and Vandendael, I. and Blajiev, O. and Hubin, A. and Davenport, A.J. and Raes, M. and Terryn, H. and DLS) and Vrije)},
abstractNote = {},
doi = {10.1016/j.elecom.2010.03.013},
journal = {Electrochem. Commun.},
number = (6) ; 06, 2010,
volume = 12,
place = {United States},
year = {2014},
month = {9}
}