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Title: A (S)TEM Gas Cell Holder with Localized Laser Heating for In Situ Experiments

Abstract

The advent of aberration correction for transmission electron microscopy has transformed atomic resolution imaging into a nearly routine technique for structural analysis. Now an emerging frontier in electron microscopy is the development of in situ capabilities to observe reactions at atomic resolution in real time and within realistic environments. Here we present a new in situ gas cell holder that is designed for compatibility with a wide variety of sample type (i.e., dimpled 3-mm discs, standard mesh grids, various types of focused ion beam lamellae attached to half grids). Its capabilities include localized heating and precise control of the gas pressure and composition while simultaneously allowing atomic resolution imaging at ambient pressure. The results show that 0.25-nm lattice fringes are directly visible for nanoparticles imaged at ambient pressure with gas path lengths up to 20 μm. Additionally, we quantitatively demonstrate that while the attainable contrast and resolution decrease with increasing pressure and gas path length, resolutions better than 0.2 nm should be accessible at ambient pressure with gas path lengths less than the 15 μm utilized for these experiments.

Authors:
; ; ; ; ; ; ; ; ;
Publication Date:
Research Org.:
Pacific Northwest National Lab. (PNNL), Richland, WA (United States). Environmental Molecular Sciences Lab. (EMSL)
Sponsoring Org.:
USDOE
OSTI Identifier:
1074301
Report Number(s):
PNNL-SA-88937
Journal ID: ISSN 1431-9276; 47296
DOE Contract Number:  
AC05-76RL01830
Resource Type:
Journal Article
Journal Name:
Microscopy and Microanalysis
Additional Journal Information:
Journal Volume: 19; Journal Issue: 02; Journal ID: ISSN 1431-9276
Publisher:
Microscopy Society of America (MSA)
Country of Publication:
United States
Language:
English
Subject:
in situ gas; STEM; environmental microscopy; aberration correction; Environmental Molecular Sciences Laboratory

Citation Formats

Mehraeen, Shareghe, McKeown, Joseph T., Deshmukh, Pushkarraj V., Evans, James E., Abellan, Patricia, Xu, Pinghong, Reed, Bryan W., Taheri, Mitra L., Fischione, Paul E., and Browning, Nigel D. A (S)TEM Gas Cell Holder with Localized Laser Heating for In Situ Experiments. United States: N. p., 2013. Web. doi:10.1017/S1431927612014419.
Mehraeen, Shareghe, McKeown, Joseph T., Deshmukh, Pushkarraj V., Evans, James E., Abellan, Patricia, Xu, Pinghong, Reed, Bryan W., Taheri, Mitra L., Fischione, Paul E., & Browning, Nigel D. A (S)TEM Gas Cell Holder with Localized Laser Heating for In Situ Experiments. United States. https://doi.org/10.1017/S1431927612014419
Mehraeen, Shareghe, McKeown, Joseph T., Deshmukh, Pushkarraj V., Evans, James E., Abellan, Patricia, Xu, Pinghong, Reed, Bryan W., Taheri, Mitra L., Fischione, Paul E., and Browning, Nigel D. 2013. "A (S)TEM Gas Cell Holder with Localized Laser Heating for In Situ Experiments". United States. https://doi.org/10.1017/S1431927612014419.
@article{osti_1074301,
title = {A (S)TEM Gas Cell Holder with Localized Laser Heating for In Situ Experiments},
author = {Mehraeen, Shareghe and McKeown, Joseph T. and Deshmukh, Pushkarraj V. and Evans, James E. and Abellan, Patricia and Xu, Pinghong and Reed, Bryan W. and Taheri, Mitra L. and Fischione, Paul E. and Browning, Nigel D.},
abstractNote = {The advent of aberration correction for transmission electron microscopy has transformed atomic resolution imaging into a nearly routine technique for structural analysis. Now an emerging frontier in electron microscopy is the development of in situ capabilities to observe reactions at atomic resolution in real time and within realistic environments. Here we present a new in situ gas cell holder that is designed for compatibility with a wide variety of sample type (i.e., dimpled 3-mm discs, standard mesh grids, various types of focused ion beam lamellae attached to half grids). Its capabilities include localized heating and precise control of the gas pressure and composition while simultaneously allowing atomic resolution imaging at ambient pressure. The results show that 0.25-nm lattice fringes are directly visible for nanoparticles imaged at ambient pressure with gas path lengths up to 20 μm. Additionally, we quantitatively demonstrate that while the attainable contrast and resolution decrease with increasing pressure and gas path length, resolutions better than 0.2 nm should be accessible at ambient pressure with gas path lengths less than the 15 μm utilized for these experiments.},
doi = {10.1017/S1431927612014419},
url = {https://www.osti.gov/biblio/1074301}, journal = {Microscopy and Microanalysis},
issn = {1431-9276},
number = 02,
volume = 19,
place = {United States},
year = {2013},
month = {3}
}