Comparison of Beam-Based Failure Analysis Techniques for Microsystems-Enabled Photovoltaics.

Conference · Mon Apr 01 00:00:00 EDT 2013

OSTI ID:1073218

Yang, Benjamin Bing-Yeh; Cruz-Campa, Jose Luis; Haase, Gad S; Cole, Jr, Edward I; Tangyunyong, Paiboon; Okandan, Murat; Nielson, Gregory N

• Research Organization: Sandia National Laboratories (SNL), Albuquerque, NM, and Livermore, CA (United States)
• Sponsoring Organization: USDOE National Nuclear Security Administration (NNSA)
• DOE Contract Number: AC04-94AL85000
• OSTI ID: 1073218
• Report Number(s): SAND2013-2757C
• Resource Relation: Conference: Proposed for presentation at the International Symposium for Testing and Failure Analysis held November 3-7, 2013 in San Jose, CA.
• Country of Publication: United States
• Language: English