Apparatus and method for measuring critical current properties of a coated conductor

Mueller, Fred M; Haenisch, Jens

Apparatus and method for measuring critical current properties of a coated conductor

Patent · 24 July 2012

OSTI ID:1067336

Mueller, Fred M ^[1]; Haenisch, Jens ^[2]

Los Alamos, NM
Dresden, DE

The transverse critical-current uniformity in a superconducting tape was determined using a magnetic knife apparatus. A critical current I.sub.c distribution and transverse critical current density J.sub.c distribution in YBCO coated conductors was measured nondestructively with high resolution using a magnetic knife apparatus. The method utilizes the strong depression of J.sub.c in applied magnetic fields. A narrow region of low, including zero, magnetic field in a surrounding higher field is moved transversely across a sample of coated conductor. This reveals the critical current density distribution. A Fourier series inversion process was used to determine the transverse J.sub.c distribution in the sample.

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Research Organization:: Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)

Sponsoring Organization:: USDOE

DOE Contract Number:: AC52-06NA25396

Assignee:: Los Alamos National Security, LLC (Los Alamos, NM)

Patent Number(s):: 8,228,055

Application Number:: 12/560,303

OSTI ID:: 1067336

Country of Publication:: United States

Language:: English

References (17)

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