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Title: Non-Destructive Electronic Forensic Techniques for Manufacturer Attribution - LDRD Day Poster.

Authors:
Publication Date:
Research Org.:
Sandia National Laboratories (SNL), Albuquerque, NM, and Livermore, CA (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1064368
Report Number(s):
SAND2012-5515C
DOE Contract Number:  
AC04-94AL85000
Resource Type:
Conference
Resource Relation:
Conference: Proposed for presentation at the LDRD Day (Internal) held August 14, 2012 in Albuquerque, NM.
Country of Publication:
United States
Language:
English

Citation Formats

Helinski, Ryan. Non-Destructive Electronic Forensic Techniques for Manufacturer Attribution - LDRD Day Poster.. United States: N. p., 2012. Web.
Helinski, Ryan. Non-Destructive Electronic Forensic Techniques for Manufacturer Attribution - LDRD Day Poster.. United States.
Helinski, Ryan. 2012. "Non-Destructive Electronic Forensic Techniques for Manufacturer Attribution - LDRD Day Poster.". United States.
@article{osti_1064368,
title = {Non-Destructive Electronic Forensic Techniques for Manufacturer Attribution - LDRD Day Poster.},
author = {Helinski, Ryan},
abstractNote = {},
doi = {},
url = {https://www.osti.gov/biblio/1064368}, journal = {},
number = ,
volume = ,
place = {United States},
year = {2012},
month = {7}
}

Conference:
Other availability
Please see Document Availability for additional information on obtaining the full-text document. Library patrons may search WorldCat to identify libraries that hold this conference proceeding.

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