Quantitative Measurements of X-ray Intensity
This chapter describes the characterization of several X-ray sources and their use in calibrating different types of X-ray cameras at National Security Technologies, LLC (NSTec). The cameras are employed in experimental plasma studies at Lawrence Livermore National Laboratory (LLNL), including the National Ignition Facility (NIF). The sources provide X-rays in the energy range from several hundred eV to 110 keV. The key to this effort is measuring the X-ray beam intensity accurately and traceable to international standards. This is accomplished using photodiodes of several types that are calibrated using radioactive sources and a synchrotron source using methods and materials that are traceable to the U.S. National Institute of Standards and Technology (NIST). The accreditation procedures are described. The chapter begins with an introduction to the fundamental concepts of X-ray physics. The types of X-ray sources that are used for device calibration are described. The next section describes the photodiode types that are used for measuring X-ray intensity: power measuring photodiodes, energy dispersive photodiodes, and cameras comprising photodiodes as pixel elements. Following their description, the methods used to calibrate the primary detectors, the power measuring photodiodes and the energy dispersive photodiodes, as well as the method used to get traceability to international standards are described. The X-ray source beams can then be measured using the primary detectors. The final section then describes the use of the calibrated X-ray beams to calibrate X-ray cameras. Many of the references are web sites that provide databases, explanations of the data and how it was generated, and data calculations for specific cases. Several general reference books related to the major topics are included. Papers expanding some subjects are cited.
- Research Organization:
- Nevada Test Site (NTS), Mercury, NV (United States)
- Sponsoring Organization:
- USDOE National Nuclear Security Administration (NNSA)
- DOE Contract Number:
- DE-AC52-06NA25946
- OSTI ID:
- 1062981
- Report Number(s):
- DOE/NV/25946-1216
- Resource Relation:
- Related Information: Reference info: Michael J. Haugh and Marilyn Schneider (2011). Quantitative Measurements of X-Ray Intensity, Photodiodes - Communications, Bio-Sensings, Measurements and High-Energy Physics, Associate Professor Jin-Wei Shi (Ed.), ISBN: 978-953-307-277-7, InTech, DOI: 10.5772/18261. Available from: http://www.intechopen.com/books/photodiodes-communications-bio-sensings-measurements-and-high-energy-physics/quantitative-measurements-of-x-ray-intensity
- Country of Publication:
- United States
- Language:
- English
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