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Title: Calorimeters for Precision Power Dissipation Measurements on Controlled-Temperature Superconducting Radiofrequency Samples

Abstract

Two calorimeters, with stainless steel and Cu as the thermal path material for high precision and high power versions, respectively, have been designed and commissioned for the surface impedance characterization (SIC) system at Jefferson Lab to provide low temperature control and measurement for CW power up to 22 W on a 5 cm dia. disk sample which is thermally isolated from the RF portion of the system. A power compensation method has been developed to measure the RF induced power on the sample. Simulation and experimental results show that with these two calorimeters, the whole thermal range of interest for superconducting radiofrequency (SRF) materials has been covered. The power measurement error in the interested power range is within 1.2% and 2.7% for the high precision and high power versions, respectively. Temperature distributions on the sample surface for both versions have been simulated and the accuracy of sample temperature measurements have been analysed. Both versions have the ability to accept bulk superconductors and thin film superconducting samples with a variety of substrate materials such as Al, Al{sub 2}O{sub 3}, Cu, MgO, Nb and Si.

Authors:
; ; ;
Publication Date:
Research Org.:
Thomas Jefferson National Accelerator Facility (TJNAF), Newport News, VA (United States)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
1059017
Report Number(s):
JLAB-ACC-12-1507; DOE/OR/23177-2038
Journal ID: ISSN 0034-6748; TRN: US1300386
DOE Contract Number:  
AC05-06OR23177
Resource Type:
Journal Article
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 83; Journal Issue: 12; Journal ID: ISSN 0034-6748
Country of Publication:
United States
Language:
English
Subject:
43 PARTICLE ACCELERATORS; 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY

Citation Formats

Xiao, Binping P., Kelley, Michael J., Reece, Charles E., and Phillips, H. L. Calorimeters for Precision Power Dissipation Measurements on Controlled-Temperature Superconducting Radiofrequency Samples. United States: N. p., 2012. Web. doi:10.1063/1.4770117.
Xiao, Binping P., Kelley, Michael J., Reece, Charles E., & Phillips, H. L. Calorimeters for Precision Power Dissipation Measurements on Controlled-Temperature Superconducting Radiofrequency Samples. United States. https://doi.org/10.1063/1.4770117
Xiao, Binping P., Kelley, Michael J., Reece, Charles E., and Phillips, H. L. Sat . "Calorimeters for Precision Power Dissipation Measurements on Controlled-Temperature Superconducting Radiofrequency Samples". United States. https://doi.org/10.1063/1.4770117.
@article{osti_1059017,
title = {Calorimeters for Precision Power Dissipation Measurements on Controlled-Temperature Superconducting Radiofrequency Samples},
author = {Xiao, Binping P. and Kelley, Michael J. and Reece, Charles E. and Phillips, H. L.},
abstractNote = {Two calorimeters, with stainless steel and Cu as the thermal path material for high precision and high power versions, respectively, have been designed and commissioned for the surface impedance characterization (SIC) system at Jefferson Lab to provide low temperature control and measurement for CW power up to 22 W on a 5 cm dia. disk sample which is thermally isolated from the RF portion of the system. A power compensation method has been developed to measure the RF induced power on the sample. Simulation and experimental results show that with these two calorimeters, the whole thermal range of interest for superconducting radiofrequency (SRF) materials has been covered. The power measurement error in the interested power range is within 1.2% and 2.7% for the high precision and high power versions, respectively. Temperature distributions on the sample surface for both versions have been simulated and the accuracy of sample temperature measurements have been analysed. Both versions have the ability to accept bulk superconductors and thin film superconducting samples with a variety of substrate materials such as Al, Al{sub 2}O{sub 3}, Cu, MgO, Nb and Si.},
doi = {10.1063/1.4770117},
url = {https://www.osti.gov/biblio/1059017}, journal = {Review of Scientific Instruments},
issn = {0034-6748},
number = 12,
volume = 83,
place = {United States},
year = {2012},
month = {12}
}