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Title: Selective stress-based microcantilever sensors for enhanced surveillance.

Authors:
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  1. (Sandia National Laboratories, Albuquerque, NM)
  2. (Biolin Scientific, Inc., Linthicum Heights, MD)
  3. (Intel Corporation, Rio Ranch, NM)
  4. (Georgia Institute of Technology, Atlanta, GA)
Publication Date:
Research Org.:
Sandia National Laboratories
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1057255
Report Number(s):
SAND2012-9664
DOE Contract Number:  
AC04-94AL85000
Resource Type:
Technical Report
Country of Publication:
United States
Language:
English

Citation Formats

Allendorf, Mark D., Katzenmeyer, Aaron Michael, Stavilla, Vitalie, Volponi, Joanne V., Criscenti, Louise Jacqueline, Greathouse, Jeffery A., Guilinger, Terry Rae, Ockwig, Nathan W., Pohl, Phillip Isabio, Robinson, Alex Lockwood, Thornberg, Steven Michael, White, Michael I., Zeitler, Todd R., Dixon, Matthew C., Lee, Jin-Hwan, Demir, Hakan, Sholl, David S., Van Heest, Timothy, Ellern, I., Hesketh, Peter J., and Venkatasubramanian, Anandram. Selective stress-based microcantilever sensors for enhanced surveillance.. United States: N. p., 2012. Web. doi:10.2172/1057255.
Allendorf, Mark D., Katzenmeyer, Aaron Michael, Stavilla, Vitalie, Volponi, Joanne V., Criscenti, Louise Jacqueline, Greathouse, Jeffery A., Guilinger, Terry Rae, Ockwig, Nathan W., Pohl, Phillip Isabio, Robinson, Alex Lockwood, Thornberg, Steven Michael, White, Michael I., Zeitler, Todd R., Dixon, Matthew C., Lee, Jin-Hwan, Demir, Hakan, Sholl, David S., Van Heest, Timothy, Ellern, I., Hesketh, Peter J., & Venkatasubramanian, Anandram. Selective stress-based microcantilever sensors for enhanced surveillance.. United States. doi:10.2172/1057255.
Allendorf, Mark D., Katzenmeyer, Aaron Michael, Stavilla, Vitalie, Volponi, Joanne V., Criscenti, Louise Jacqueline, Greathouse, Jeffery A., Guilinger, Terry Rae, Ockwig, Nathan W., Pohl, Phillip Isabio, Robinson, Alex Lockwood, Thornberg, Steven Michael, White, Michael I., Zeitler, Todd R., Dixon, Matthew C., Lee, Jin-Hwan, Demir, Hakan, Sholl, David S., Van Heest, Timothy, Ellern, I., Hesketh, Peter J., and Venkatasubramanian, Anandram. Thu . "Selective stress-based microcantilever sensors for enhanced surveillance.". United States. doi:10.2172/1057255. https://www.osti.gov/servlets/purl/1057255.
@article{osti_1057255,
title = {Selective stress-based microcantilever sensors for enhanced surveillance.},
author = {Allendorf, Mark D. and Katzenmeyer, Aaron Michael and Stavilla, Vitalie and Volponi, Joanne V. and Criscenti, Louise Jacqueline and Greathouse, Jeffery A. and Guilinger, Terry Rae and Ockwig, Nathan W. and Pohl, Phillip Isabio and Robinson, Alex Lockwood and Thornberg, Steven Michael and White, Michael I. and Zeitler, Todd R. and Dixon, Matthew C. and Lee, Jin-Hwan and Demir, Hakan and Sholl, David S. and Van Heest, Timothy and Ellern, I. and Hesketh, Peter J. and Venkatasubramanian, Anandram},
abstractNote = {},
doi = {10.2172/1057255},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2012},
month = {11}
}

Technical Report:

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