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Title: Testing of CMOS Devices in NIF's Harsh Neutron Environment

Conference ·
DOI:https://doi.org/10.1117/12.930132· OSTI ID:1057238

Research Organization:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
W-7405-ENG-48
OSTI ID:
1057238
Report Number(s):
LLNL-CONF-567712
Resource Relation:
Journal Volume: 8505; Conference: Presented at: 2012 SPIE Conference, San Diego, CA, United States, Aug 12 - Aug 16, 2012
Country of Publication:
United States
Language:
English

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