Infrared Emissivity of Tin upon Release of a 25 GPa Shock into a LiF Window
We measured the emissivity of a tin sample at its interface with a lithium-fluoride window upon release of a 25 GPa shock wave from the tin into the window. Measurements were made over four wavelength bands between 1.2 and 5.4 μm. Thermal emission backgrounds from the tin, glue, and lithium fluoride were successfully removed from the reflectance signals. Emissivity changes for the sample, which was initially nearly specular, were small except for the longest wavelength band, where uncertainties were high because of poor signal-to-noise ratio at that wavelength. A thin glue layer, which bonds the sample to the window, was found to heat from reverberations of the shock wave between the tin and the lithium fluoride. At approximately 3.4 μm the thermal emission from the glue was large compared to the tin, allowing a good estimate of the glue temperature from the thermal radiance. The glue appears to remain slightly colder than the tin, thereby minimizing heat conduction into or out of the tin immediately after the shock passage.
- Research Organization:
- Nevada Test Site (NTS), Mercury, NV (United States)
- Sponsoring Organization:
- USDOE National Nuclear Security Administration (NNSA)
- DOE Contract Number:
- DE-AC52-06NA25946
- OSTI ID:
- 1055517
- Report Number(s):
- DOE/NV/25946-1238
- Journal Information:
- Journal of Applied Physics, Vol. 110, Issue 10
- Country of Publication:
- United States
- Language:
- English
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