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Title: Thickness measurements of nanoscale brine films on silica surfaces under geologic CO[subscript 2] sequestration conditions using synchrotron X-ray fluorescence

Authors:
; ; ; ; ;  [1]
  1. LBNL
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
Sponsoring Org.:
DOE - BASIC ENERGY SCIENCES
OSTI Identifier:
1054002
Resource Type:
Journal Article
Journal Name:
Water Resour. Res.
Additional Journal Information:
Journal Volume: 48; Journal Issue: 2012
Country of Publication:
United States
Language:
ENGLISH

Citation Formats

Kim, Tae Wook, Tokunaga, Tetsu K, Shuman, Derek B, Sutton, Stephen R, Newville, Matt, Lanzirotti, Antonio, and UC). Thickness measurements of nanoscale brine films on silica surfaces under geologic CO[subscript 2] sequestration conditions using synchrotron X-ray fluorescence. United States: N. p., 2013. Web. doi:10.1029/2012WR012200.
Kim, Tae Wook, Tokunaga, Tetsu K, Shuman, Derek B, Sutton, Stephen R, Newville, Matt, Lanzirotti, Antonio, & UC). Thickness measurements of nanoscale brine films on silica surfaces under geologic CO[subscript 2] sequestration conditions using synchrotron X-ray fluorescence. United States. doi:10.1029/2012WR012200.
Kim, Tae Wook, Tokunaga, Tetsu K, Shuman, Derek B, Sutton, Stephen R, Newville, Matt, Lanzirotti, Antonio, and UC). Thu . "Thickness measurements of nanoscale brine films on silica surfaces under geologic CO[subscript 2] sequestration conditions using synchrotron X-ray fluorescence". United States. doi:10.1029/2012WR012200.
@article{osti_1054002,
title = {Thickness measurements of nanoscale brine films on silica surfaces under geologic CO[subscript 2] sequestration conditions using synchrotron X-ray fluorescence},
author = {Kim, Tae Wook and Tokunaga, Tetsu K and Shuman, Derek B and Sutton, Stephen R and Newville, Matt and Lanzirotti, Antonio and UC)},
abstractNote = {},
doi = {10.1029/2012WR012200},
journal = {Water Resour. Res.},
number = 2012,
volume = 48,
place = {United States},
year = {2013},
month = {1}
}

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    Works referencing / citing this record:

    Interrelationship between water film thicknesses and contact angles and a model for CO 2 adhesion
    journal, April 2019