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Title: Thickness measurements of nanoscale brine films on silica surfaces under geologic CO2 sequestration conditions using synchrotron X-ray fluorescence

Authors:
; ; ; ; ;
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
Sponsoring Org.:
DOE - BASIC ENERGY SCIENCES
OSTI Identifier:
1054002
Resource Type:
Journal Article
Journal Name:
Water Resources Research
Additional Journal Information:
Journal Volume: 48; Journal Issue: 9; Journal ID: ISSN 0043-1397
Publisher:
American Geophysical Union (AGU)
Country of Publication:
United States
Language:
ENGLISH

Citation Formats

Kim, Tae Wook, Tokunaga, Tetsu K., Shuman, Derek B., Sutton, Stephen R., Newville, Matt, and Lanzirotti, Antonio. Thickness measurements of nanoscale brine films on silica surfaces under geologic CO2 sequestration conditions using synchrotron X-ray fluorescence. United States: N. p., 2012. Web. doi:10.1029/2012WR012200.
Kim, Tae Wook, Tokunaga, Tetsu K., Shuman, Derek B., Sutton, Stephen R., Newville, Matt, & Lanzirotti, Antonio. Thickness measurements of nanoscale brine films on silica surfaces under geologic CO2 sequestration conditions using synchrotron X-ray fluorescence. United States. https://doi.org/10.1029/2012WR012200
Kim, Tae Wook, Tokunaga, Tetsu K., Shuman, Derek B., Sutton, Stephen R., Newville, Matt, and Lanzirotti, Antonio. 2012. "Thickness measurements of nanoscale brine films on silica surfaces under geologic CO2 sequestration conditions using synchrotron X-ray fluorescence". United States. https://doi.org/10.1029/2012WR012200.
@article{osti_1054002,
title = {Thickness measurements of nanoscale brine films on silica surfaces under geologic CO2 sequestration conditions using synchrotron X-ray fluorescence},
author = {Kim, Tae Wook and Tokunaga, Tetsu K. and Shuman, Derek B. and Sutton, Stephen R. and Newville, Matt and Lanzirotti, Antonio},
abstractNote = {},
doi = {10.1029/2012WR012200},
url = {https://www.osti.gov/biblio/1054002}, journal = {Water Resources Research},
issn = {0043-1397},
number = 9,
volume = 48,
place = {United States},
year = {Sat Sep 01 00:00:00 EDT 2012},
month = {Sat Sep 01 00:00:00 EDT 2012}
}

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Works referencing / citing this record:

CO 2 Wettability of Sandstones: Addressing Conflicting Capillary Behaviors
journal, January 2019


Interrelationship between water film thicknesses and contact angles and a model for CO 2 adhesion
journal, April 2019