Atmospheric-pressure plasma-enhanced chemical vapor deposition of a-SiCN:H films: Role of precursors on the film growth and properties
- North Dakota State Univ., Fargo, ND (United States)
Atmospheric pressure plasma enhanced chemical vapor deposition (AP-PECVD) using Surfx AtomflowTM 250D APPJ was utilized to synthesize amorphous silicon carbonitride coatings using tetramethyldisilizane (TMDZ) and hexamethyldisilizane (HMDZ) as the single source precursors. The effect of precursor chemistry and the substrate temperature (Ts) on the properties of a-SiCN:H films were evaluated, while nitrogen was used as the reactive gas. Surface morphology of the films was evaluated using atomic force microscopy (AFM); chemical properties were determined using Fourier transform infrared spectroscopy (FTIR); thickness and optical properties were determined using spectroscopic ellipsometry and mechanical properties were determined using nano-indentation. In general films deposited at substrate temperature (Ts) <200 °C contained organic moieties, while the films deposited at Ts >200 oC depicted strong Si-N and Si-CN absorption. Refractive indices (n) of the thin films showed values between 1.5 -2.0 depending on the deposition parameters. Mechanical properties of the films determined using nano-indentation revealed that these films have hardness between 0.5 GPa to 15 GPa depending on the Ts. AFM evaluation of the films showed high roughness (Ra) values of 2-3 nm for the films grown at low Ts (< 250 °C), while the films grown at Ts ≥ 300 °C exhibited atomically smooth surface with Ra of ~ 0.5 nm. Furthermore, based on the gas phase (plasma) chemistry, precursor chemistry and the other experimental observations, a possible growth model that prevails in the AP-PECVD of a-SiCN:H thin films is proposed.
- Research Organization:
- North Dakota State Univ., Fargo, ND (United States)
- Sponsoring Organization:
- USDOE Office of Energy Efficiency and Renewable Energy (EERE)
- Grant/Contract Number:
- FG36-08GO88160
- OSTI ID:
- 1053814
- Report Number(s):
- DOE/GO/88160-48
- Journal Information:
- ACS Applied Materials and Interfaces, Vol. 4, Issue 10; ISSN 1944-8244
- Publisher:
- American Chemical Society (ACS)Copyright Statement
- Country of Publication:
- United States
- Language:
- English
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