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Title: A comparative study of Langmuir surfactant films: Grazing incidence x-ray off-specular scattering vs. x-ray specular reflectivity

Authors:
; ; ; ; ;  [1];  [2]
  1. (UCSD)
  2. (
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
Sponsoring Org.:
National Science Foundation (NSF)
OSTI Identifier:
1052861
Resource Type:
Journal Article
Journal Name:
J. Appl. Phys.
Additional Journal Information:
Journal Volume: 110; Journal Issue: (10) ; 11, 2011
Country of Publication:
United States
Language:
ENGLISH

Citation Formats

Dai, Yeling, Lin, Binhua, Meron, Mati, Kim, Kyungil, Leahy, Brian, Shpyrko, Oleg G., and UC). A comparative study of Langmuir surfactant films: Grazing incidence x-ray off-specular scattering vs. x-ray specular reflectivity. United States: N. p., 2012. Web. doi:10.1063/1.3661980.
Dai, Yeling, Lin, Binhua, Meron, Mati, Kim, Kyungil, Leahy, Brian, Shpyrko, Oleg G., & UC). A comparative study of Langmuir surfactant films: Grazing incidence x-ray off-specular scattering vs. x-ray specular reflectivity. United States. doi:10.1063/1.3661980.
Dai, Yeling, Lin, Binhua, Meron, Mati, Kim, Kyungil, Leahy, Brian, Shpyrko, Oleg G., and UC). Tue . "A comparative study of Langmuir surfactant films: Grazing incidence x-ray off-specular scattering vs. x-ray specular reflectivity". United States. doi:10.1063/1.3661980.
@article{osti_1052861,
title = {A comparative study of Langmuir surfactant films: Grazing incidence x-ray off-specular scattering vs. x-ray specular reflectivity},
author = {Dai, Yeling and Lin, Binhua and Meron, Mati and Kim, Kyungil and Leahy, Brian and Shpyrko, Oleg G. and UC)},
abstractNote = {},
doi = {10.1063/1.3661980},
journal = {J. Appl. Phys.},
number = (10) ; 11, 2011,
volume = 110,
place = {United States},
year = {2012},
month = {11}
}