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Title: Investigating the Defect Structures in Transparent Conducting Oxides Using X-ray and Neutron Scattering Techniques

Abstract

Transparent conducting oxide (TCO) materials are implemented into a wide variety of commercial devices because they possess a unique combination of high optical transparency and high electrical conductivity. Created during the processing of the TCOs, defects within the atomic-scale structure are responsible for their desirable optical and electrical properties. Therefore, studying the defect structure is essential to a better understanding of the behavior of transparent conductors. X-ray and neutron scattering techniques are powerful tools to investigate the atomic lattice structural defects in these materials. This review paper presents some of the current developments in the study of structural defects in n-type TCOs using x-ray diffraction (XRD), neutron diffraction, extended x-ray absorption fine structure (EXAFS), pair distribution functions (PDFs), and x-ray fluorescence (XRF).

Authors:
 [1]
  1. (DePaul)
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
Sponsoring Org.:
UNIVERSITY
OSTI Identifier:
1051123
Resource Type:
Journal Article
Journal Name:
Materials
Additional Journal Information:
Journal Volume: 5; Journal Issue: (5) ; 2012
Country of Publication:
United States
Language:
ENGLISH
Subject:
72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS; ABSORPTION; DEFECTS; DISTRIBUTION FUNCTIONS; ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; FINE STRUCTURE; FLUORESCENCE; NEUTRON DIFFRACTION; NEUTRONS; OXIDES; PROCESSING; SCATTERING; X-RAY DIFFRACTION

Citation Formats

González, Gabriela B. Investigating the Defect Structures in Transparent Conducting Oxides Using X-ray and Neutron Scattering Techniques. United States: N. p., 2012. Web. doi:10.3390/ma5050818.
González, Gabriela B. Investigating the Defect Structures in Transparent Conducting Oxides Using X-ray and Neutron Scattering Techniques. United States. doi:10.3390/ma5050818.
González, Gabriela B. Tue . "Investigating the Defect Structures in Transparent Conducting Oxides Using X-ray and Neutron Scattering Techniques". United States. doi:10.3390/ma5050818.
@article{osti_1051123,
title = {Investigating the Defect Structures in Transparent Conducting Oxides Using X-ray and Neutron Scattering Techniques},
author = {González, Gabriela B.},
abstractNote = {Transparent conducting oxide (TCO) materials are implemented into a wide variety of commercial devices because they possess a unique combination of high optical transparency and high electrical conductivity. Created during the processing of the TCOs, defects within the atomic-scale structure are responsible for their desirable optical and electrical properties. Therefore, studying the defect structure is essential to a better understanding of the behavior of transparent conductors. X-ray and neutron scattering techniques are powerful tools to investigate the atomic lattice structural defects in these materials. This review paper presents some of the current developments in the study of structural defects in n-type TCOs using x-ray diffraction (XRD), neutron diffraction, extended x-ray absorption fine structure (EXAFS), pair distribution functions (PDFs), and x-ray fluorescence (XRF).},
doi = {10.3390/ma5050818},
journal = {Materials},
number = (5) ; 2012,
volume = 5,
place = {United States},
year = {2012},
month = {10}
}