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Title: Beam Profile Measurement at 30 GeV Using Optical Transition Radiation

Abstract

We present results of measurements of spot size and angular divergence of a 30 GeV electron beam through use of optical transition radiation (OTR). The OTR near field pattern and far field distribution are measured as a function of beam spot size and divergence at wavelengths of 441, 532, and 800 nm, for both the single and double foil configurations. Electron beam spot sizes of 50 {micro}m rms have been resolved, demonstrating the utility of OTR for measurement of small beam spot sizes of high energy (30 GeV) electron beams. Two-foil interference was clearly observed and utilized electron beam angular divergences of {approximately} 100 {micro}rad.

Authors:
Publication Date:
Research Org.:
Stanford Linear Accelerator Center, Menlo Park, CA (US)
Sponsoring Org.:
USDOE Office of Energy Research (ER) (US)
OSTI Identifier:
10510
Report Number(s):
SLAC-PUB-8190
TRN: US0103575
DOE Contract Number:  
AC03-76SF00515
Resource Type:
Technical Report
Resource Relation:
Other Information: PBD: 10 Jul 1999
Country of Publication:
United States
Language:
English
Subject:
43 PARTICLE ACCELERATORS; BEAM PROFILES; ELECTRON BEAMS; TRANSITION RADIATION; WAVELENGTHS; GEV RANGE 10-100; BEAM MONITORING

Citation Formats

Whittum, David H. Beam Profile Measurement at 30 GeV Using Optical Transition Radiation. United States: N. p., 1999. Web. doi:10.2172/10510.
Whittum, David H. Beam Profile Measurement at 30 GeV Using Optical Transition Radiation. United States. doi:10.2172/10510.
Whittum, David H. Sat . "Beam Profile Measurement at 30 GeV Using Optical Transition Radiation". United States. doi:10.2172/10510. https://www.osti.gov/servlets/purl/10510.
@article{osti_10510,
title = {Beam Profile Measurement at 30 GeV Using Optical Transition Radiation},
author = {Whittum, David H},
abstractNote = {We present results of measurements of spot size and angular divergence of a 30 GeV electron beam through use of optical transition radiation (OTR). The OTR near field pattern and far field distribution are measured as a function of beam spot size and divergence at wavelengths of 441, 532, and 800 nm, for both the single and double foil configurations. Electron beam spot sizes of 50 {micro}m rms have been resolved, demonstrating the utility of OTR for measurement of small beam spot sizes of high energy (30 GeV) electron beams. Two-foil interference was clearly observed and utilized electron beam angular divergences of {approximately} 100 {micro}rad.},
doi = {10.2172/10510},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1999},
month = {7}
}

Technical Report:

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