Surface Impedance Measurements of Single Crystal MgB2 Films for Radiofrequency Superconductivity Applications

doi:https://doi.org/10.1088/0953-2048/25/9/095006

Title: Surface Impedance Measurements of Single Crystal MgB2 Films for Radiofrequency Superconductivity Applications

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Abstract

We report microstructure analyses and superconducting radiofrequency (SRF) measurements of large scale epitaxial MgB{sub 2} films. MgB{sub 2} films on 5 cm dia. sapphire disks were fabricated by a Hybrid Physical Chemical Vapor Deposition (HPCVD) technique. The electron-beam backscattering diffraction (EBSD) results suggest that the film is a single crystal complying with a MgB{sub 2}(0001) {parallel} Al{sub 2}O{sub 3}(0001) epitaxial relationship. The SRF properties of different film thicknesses (200 nm and 350 nm) were evaluated under different temperatures and applied fields at 7.4 GHz. A surface resistance of 9 {+-} 2 {mu}{Omega} has been observed at 2.2 K.

Authors:: Binping Xiao, Xin Zhao, Joshua Spradlin, Charles Reece, Michael Kelley, Teng Tan, Xi Xiaoxing

Publication Date:: 2012-07-01

Research Org.:: Thomas Jefferson National Accelerator Facility (TJNAF), Newport News, VA (United States)

Sponsoring Org.:: USDOE Office of Science (SC)

OSTI Identifier:: 1047482

Report Number(s):: JLAB-ACC-12-1492; DOE/OR/23177-1990
Journal ID: ISSN 0953-2048; SUSTEF; TRN: US201216%%297

DOE Contract Number:: AC05-06OR23177

Resource Type:: Journal Article

Journal Name:: Superconductor Science and Technology

Additional Journal Information:: Journal Volume: 25; Journal Issue: 9; Journal ID: ISSN 0953-2048

Country of Publication:: United States

Language:: English

Subject:: 36 MATERIALS SCIENCE; BACKSCATTERING; CHEMICAL VAPOR DEPOSITION; DIFFRACTION; IMPEDANCE; MICROSTRUCTURE; MONOCRYSTALS; SAPPHIRE; SUPERCONDUCTIVITY

Citation Formats


                    Binping Xiao, Xin Zhao, Joshua Spradlin, Charles Reece, Michael Kelley, Teng Tan, Xi Xiaoxing. Surface Impedance Measurements of Single Crystal MgB2 Films for Radiofrequency Superconductivity Applications.  United States: N. p., 2012. 
        Web.  doi:10.1088/0953-2048/25/9/095006.

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                    Binping Xiao, Xin Zhao, Joshua Spradlin, Charles Reece, Michael Kelley, Teng Tan, Xi Xiaoxing. Surface Impedance Measurements of Single Crystal MgB2 Films for Radiofrequency Superconductivity Applications.  United States.  https://doi.org/10.1088/0953-2048/25/9/095006

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                    Binping Xiao, Xin Zhao, Joshua Spradlin, Charles Reece, Michael Kelley, Teng Tan, Xi Xiaoxing. Sun .  
        "Surface Impedance Measurements of Single Crystal MgB2 Films for Radiofrequency Superconductivity Applications".  United States.  https://doi.org/10.1088/0953-2048/25/9/095006.  https://www.osti.gov/servlets/purl/1047482.

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@article{osti_1047482,

  title        = {Surface Impedance Measurements of Single Crystal MgB2 Films for Radiofrequency Superconductivity Applications},

  author       = {Binping Xiao, Xin Zhao, Joshua Spradlin, Charles Reece, Michael Kelley, Teng Tan, Xi Xiaoxing},

  abstractNote = {We report microstructure analyses and superconducting radiofrequency (SRF) measurements of large scale epitaxial MgB{sub 2} films. MgB{sub 2} films on 5 cm dia. sapphire disks were fabricated by a Hybrid Physical Chemical Vapor Deposition (HPCVD) technique. The electron-beam backscattering diffraction (EBSD) results suggest that the film is a single crystal complying with a MgB{sub 2}(0001) {parallel} Al{sub 2}O{sub 3}(0001) epitaxial relationship. The SRF properties of different film thicknesses (200 nm and 350 nm) were evaluated under different temperatures and applied fields at 7.4 GHz. A surface resistance of 9 {+-} 2 {mu}{Omega} has been observed at 2.2 K.},

  doi          = {10.1088/0953-2048/25/9/095006},

  url          = {https://www.osti.gov/biblio/1047482},
  journal      = {Superconductor Science and Technology},

  issn         = {0953-2048},

  number       = 9,

  volume       = 25,

  place        = {United States},

  year         = {2012},

  month        = {7}

}

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