skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Area detector corrections for high quality synchrotron X-ray structure factor measurements

Abstract

Correction procedures for obtaining accurate X-ray structure factors from large area detectors are considered, including subpanel effects, over excited pixels and careful intensity corrections. Problems associated with data normalization, the use of a pixel response correction from a glass standard and minimization of systematic errors are also discussed. Data from glassy GeSe{sub 2} and liquid water measured with a Perkin Elmer amorphous-Silicon detector are used to demonstrate the effectiveness of these correction procedures. This requires reduction of systematic errors in the measured intensity to around the 0.1% level.

Authors:
; ;
Publication Date:
Research Org.:
BROOKHAVEN NATIONAL LABORATORY (BNL)
Sponsoring Org.:
USDOE SC OFFICE OF SCIENCE (SC)
OSTI Identifier:
1043993
Report Number(s):
BNL-97083-2012-JA
Journal ID: ISSN 0168-9002; NIMAER; R&D Project: LS001; TRN: US1203308
DOE Contract Number:  
DE-AC02-98CH10886
Resource Type:
Journal Article
Journal Name:
Nuclear Instruments and Methods in Physics Research, Section A
Additional Journal Information:
Journal Volume: 662; Journal Issue: 1; Journal ID: ISSN 0168-9002
Country of Publication:
United States
Language:
English
Subject:
12 MANAGEMENT OF RADIOACTIVE WASTES, AND NON-RADIOACTIVE WASTES FROM NUCLEAR FACILITIES; 36 MATERIALS SCIENCE; GLASS; MINIMIZATION; STRUCTURE FACTORS; SYNCHROTRONS; WATER; X-RAY DIFFRACTION

Citation Formats

Skinner L. B., Parise J., and Benmore, C. Area detector corrections for high quality synchrotron X-ray structure factor measurements. United States: N. p., 2011. Web.
Skinner L. B., Parise J., & Benmore, C. Area detector corrections for high quality synchrotron X-ray structure factor measurements. United States.
Skinner L. B., Parise J., and Benmore, C. Sat . "Area detector corrections for high quality synchrotron X-ray structure factor measurements". United States.
@article{osti_1043993,
title = {Area detector corrections for high quality synchrotron X-ray structure factor measurements},
author = {Skinner L. B. and Parise J. and Benmore, C.},
abstractNote = {Correction procedures for obtaining accurate X-ray structure factors from large area detectors are considered, including subpanel effects, over excited pixels and careful intensity corrections. Problems associated with data normalization, the use of a pixel response correction from a glass standard and minimization of systematic errors are also discussed. Data from glassy GeSe{sub 2} and liquid water measured with a Perkin Elmer amorphous-Silicon detector are used to demonstrate the effectiveness of these correction procedures. This requires reduction of systematic errors in the measured intensity to around the 0.1% level.},
doi = {},
journal = {Nuclear Instruments and Methods in Physics Research, Section A},
issn = {0168-9002},
number = 1,
volume = 662,
place = {United States},
year = {2011},
month = {10}
}