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Title: Nanomanipulation and nanofabrication with multi-probe STM: From individual atoms to nanowires

Abstract

The wide variety of nanoscale structures and devices demands novel tools for handling, assembly, and fabrication at nanoscopic positioning precision. The manipulation tools should allow for in situ characterization and testing of fundamental building blocks, such as nanotubes and nanowires, as they are built into functional devices. In this paper, a bottom-up technique for nanomanipulation and nanofabrication is reported by using a 4-probe scanning tunneling microscope (STM) combined with a scanning electron microscope (SEM). The applications of this technique are demonstrated in a variety of nanosystems, from manipulating individual atoms to bending, cutting, breaking carbon nanofibers, and constructing nanodevices for electrical characterizations. The combination of the wide field of view of SEM, the atomic position resolution of STM, and the flexibility of multiple scanning probes is expected to be a valuable tool for rapid prototyping in the nanoscience and nanotechnology.

Authors:
 [1];  [1];  [1];  [1]
  1. ORNL
Publication Date:
Research Org.:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States); Center for Nanophase Materials Sciences (CNMS)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
1043314
DOE Contract Number:  
DE-AC05-00OR22725
Resource Type:
Journal Article
Journal Name:
Reviews of Scientific Instruments
Additional Journal Information:
Journal Volume: 83; Journal Issue: 6; Journal ID: ISSN 0034-6748
Country of Publication:
United States
Language:
English

Citation Formats

Qin, Shengyong, Kim, Tae Hwan, Wang, Zhouhang, and Li, An-Ping. Nanomanipulation and nanofabrication with multi-probe STM: From individual atoms to nanowires. United States: N. p., 2012. Web. doi:10.1063/1.4727878.
Qin, Shengyong, Kim, Tae Hwan, Wang, Zhouhang, & Li, An-Ping. Nanomanipulation and nanofabrication with multi-probe STM: From individual atoms to nanowires. United States. doi:10.1063/1.4727878.
Qin, Shengyong, Kim, Tae Hwan, Wang, Zhouhang, and Li, An-Ping. Sun . "Nanomanipulation and nanofabrication with multi-probe STM: From individual atoms to nanowires". United States. doi:10.1063/1.4727878.
@article{osti_1043314,
title = {Nanomanipulation and nanofabrication with multi-probe STM: From individual atoms to nanowires},
author = {Qin, Shengyong and Kim, Tae Hwan and Wang, Zhouhang and Li, An-Ping},
abstractNote = {The wide variety of nanoscale structures and devices demands novel tools for handling, assembly, and fabrication at nanoscopic positioning precision. The manipulation tools should allow for in situ characterization and testing of fundamental building blocks, such as nanotubes and nanowires, as they are built into functional devices. In this paper, a bottom-up technique for nanomanipulation and nanofabrication is reported by using a 4-probe scanning tunneling microscope (STM) combined with a scanning electron microscope (SEM). The applications of this technique are demonstrated in a variety of nanosystems, from manipulating individual atoms to bending, cutting, breaking carbon nanofibers, and constructing nanodevices for electrical characterizations. The combination of the wide field of view of SEM, the atomic position resolution of STM, and the flexibility of multiple scanning probes is expected to be a valuable tool for rapid prototyping in the nanoscience and nanotechnology.},
doi = {10.1063/1.4727878},
journal = {Reviews of Scientific Instruments},
issn = {0034-6748},
number = 6,
volume = 83,
place = {United States},
year = {2012},
month = {1}
}