Scaling Behavior of Amplitude-Dependent Ferroelectric Hysteresis Loops in an Epitaxial PbZr0.2Ti0.8O3 Thin Film
- Seoul National University
- ORNL
- University of Suwon
We investigated the scaling behavior of ferroelectric (FE) hysteresis loops as a function of the applied field amplitude (E{sub 0}) in a high-quality epitaxial PbZr{sub 0.2}Ti{sub 0.8}O{sub 3} (PZT) thin film. We observed that the areas of the polarization-electric field hysteresis loops (A) followed the scaling law A {proportional_to} E{sub 0}{sup {alpha}}, with the exponent {alpha} = 0.45 {+-} 0.01. This result is in excellent agreement with the theoretical prediction of {alpha} by the two-dimensional Ising model. In addition, we found that the coercive field (E{sub C}) showed E{sub C} {proportional_to} E{sub 0}{sup {gamma}} with the exponent {gamma} = 0.28 {+-} 0.01. We attribute this relationship to the difference in the sweep rate of the field amplitude E{sub 0}. From the obtained {gamma} value, the growth dimension of FE domains is found to be about 1.68 in our epitaxial PZT thin film.
- Research Organization:
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC)
- DOE Contract Number:
- DE-AC05-00OR22725
- OSTI ID:
- 1042762
- Journal Information:
- Journal - Korean Physical Society, Vol. 58, Issue 3; ISSN 0374-4884
- Country of Publication:
- United States
- Language:
- English
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