Improving single slope ADC and an example implemented in FPGA with 16.7 GHz equivalent counter clook frequency
Single slope ADC is a common building block in many ASCI or FPGA based front-end systems due to its simplicity, small silicon footprint, low noise interference and low power consumption. In single slope ADC, using a Gray code counter is a popular scheme for time digitization, in which the comparator output drives the clock (CK) port of a register to latch the bits from the Gray code counter. Unfortunately, feeding the comparator output into the CK-port causes unnecessary complexities and artificial challenges. In this case, the propagation delays of all bits from the counter to the register inputs must be matched and the counter must be a Gray code one. A simple improvement on the circuit topology, i.e., feeding the comparator output into the D-port of a register, will avoid these unnecessary challenges, eliminating the requirement of the propagation delay match of the counter bits and allowing the use of regular binary counters. This scheme not only simplifies current designs for low speeds and resolutions, but also opens possibilities for applications requiring higher speeds and resolutions. A multi-channel single slope ADC based on a low-cost FPGA device has been implemented and tested. The timing measurement bin width in this work is 60 ps, which would need a 16.7 GHz counter clock had it implemented with the conventional Gray code counter scheme. A 12-bit performance is achieved using a fully differential circuit making comparison between the input and the ramping reference, both in differential format.
- Research Organization:
- Fermi National Accelerator Lab. (FNAL), Batavia, IL (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC)
- DOE Contract Number:
- AC02-07CH11359
- OSTI ID:
- 1036281
- Report Number(s):
- FERMILAB-CONF-11-586-E; TRN: US1201343
- Resource Relation:
- Conference: Presented at 2011 IEEE Nuclear Science Symposium and Medical Imaging Conference and 18th International Workshop on Room-Temperature Semiconductor X-ray and Gamma-ray Detectors, Valencia, Spain, 23-29 Oct 2011
- Country of Publication:
- United States
- Language:
- English
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