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Title: Spectral behavior of the optical constants in the visible/near infrared of GeSbSe chalcogenide thin films grown at glancing angle

Abstract

GeSbSe chalcogenide thin films were deposited using glancing angle deposition onto transparent glass substrates for the determination of the spectral behavior of the optical constants (index of refraction n and extinction coefficient k) in the visible and near infrared ranges (400-2500 nm) as a function of the deposition angle. Computational simulations based on the matrix method were employed to determine the values of the optical constants of the different films from the experimental reflectance and transmittance spectra. A significant dependence of the overall optical behavior on the deposition angle is found. Furthermore, the band gap of the GeSbSe thin films was calculated. The accurate determination of the optical constants of films grown at glancing angle will enable the development of sculptured thin film fiber-optic chemical sensors and biosensors.

Authors:
; ;
Publication Date:
Research Org.:
Pacific Northwest National Lab. (PNNL), Richland, WA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1035007
Report Number(s):
PNNL-SA-85355
Journal ID: ISSN 0734-2101; JVTAD6; TRN: US201204%%291
DOE Contract Number:  
AC05-76RL01830
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Vacuum Science and Technology, A; Journal Volume: 25; Journal Issue: 3
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; CHALCOGENIDES; DEPOSITION; GLASS; REFRACTION; SENSORS; SPECTRA; SUBSTRATES; THIN FILMS

Citation Formats

Martin-Palma, R. J., Ryan, Joseph V., and Pantano, C. G.. Spectral behavior of the optical constants in the visible/near infrared of GeSbSe chalcogenide thin films grown at glancing angle. United States: N. p., 2007. Web. doi:10.1116/1.2731353.
Martin-Palma, R. J., Ryan, Joseph V., & Pantano, C. G.. Spectral behavior of the optical constants in the visible/near infrared of GeSbSe chalcogenide thin films grown at glancing angle. United States. doi:10.1116/1.2731353.
Martin-Palma, R. J., Ryan, Joseph V., and Pantano, C. G.. Mon . "Spectral behavior of the optical constants in the visible/near infrared of GeSbSe chalcogenide thin films grown at glancing angle". United States. doi:10.1116/1.2731353.
@article{osti_1035007,
title = {Spectral behavior of the optical constants in the visible/near infrared of GeSbSe chalcogenide thin films grown at glancing angle},
author = {Martin-Palma, R. J. and Ryan, Joseph V. and Pantano, C. G.},
abstractNote = {GeSbSe chalcogenide thin films were deposited using glancing angle deposition onto transparent glass substrates for the determination of the spectral behavior of the optical constants (index of refraction n and extinction coefficient k) in the visible and near infrared ranges (400-2500 nm) as a function of the deposition angle. Computational simulations based on the matrix method were employed to determine the values of the optical constants of the different films from the experimental reflectance and transmittance spectra. A significant dependence of the overall optical behavior on the deposition angle is found. Furthermore, the band gap of the GeSbSe thin films was calculated. The accurate determination of the optical constants of films grown at glancing angle will enable the development of sculptured thin film fiber-optic chemical sensors and biosensors.},
doi = {10.1116/1.2731353},
journal = {Journal of Vacuum Science and Technology, A},
number = 3,
volume = 25,
place = {United States},
year = {Mon Apr 23 00:00:00 EDT 2007},
month = {Mon Apr 23 00:00:00 EDT 2007}
}