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Title: Epitaxial Growth of Strontium Bismuth Tantalate/Niobate of Buffered Magnesium Oxide Substrates

Abstract

Epitaxial films of strontium bismuth tantalate (SrBi{sub 2}Ta{sub 2}O{sub 9}, SBT) and strontium bismuth niobate (SrBi{sub 2}Nb{sub 2}O{sub 9}, SBN) were grown using solution deposition techniques on magnesium oxide (MgO) substrates buffered with a 100 nm layer of lanthanum manganate (LaMnO{sub 3}, LMO). Film structure and texture analyses were carried out using x-ray diffraction. Theta-2theta diffraction patterns were consistent with a c-axis aligned structure for both the buffer layer and the solution deposited films. Theta-2 theta scans revealed (001){sub SBT, SBN}//(001) LMO epitaxial relationships between the solution deposited films and the buffer layer. A pole figure about the SBT, SBN (115) reflection indicated a single in-plane epitaxy. Film quality was assessed using {omega} and {phi} scans. Nuclear Magnetic Resonance ({sup 13}C) was used to characterized the methoxy-ethoxide solutions used for the deposition of the SBN and SBT films.

Authors:
 [1];  [2];  [1];  [3];  [1]
  1. ORNL
  2. University of Tennessee, Knoxville (UTK)
  3. {nmn} [ORNL
Publication Date:
Research Org.:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
1033963
DOE Contract Number:  
DE-AC05-00OR22725
Resource Type:
Conference
Resource Relation:
Conference: Fall MRS Meeting 2006, Boston, MA, USA, 20051127, 20051201
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; BISMUTH; BUFFERS; DEPOSITION; DIFFRACTION; EPITAXY; LANTHANUM; MAGNESIUM OXIDES; MANGANATES; NIOBATES; NUCLEAR MAGNETIC RESONANCE; REFLECTION; STRONTIUM; SUBSTRATES; TANTALATES; TEXTURE; X-RAY DIFFRACTION

Citation Formats

Thomas, George H, Morrell, Johathan, Aytug, Tolga, Xue, Ziling, and Beach, David B. Epitaxial Growth of Strontium Bismuth Tantalate/Niobate of Buffered Magnesium Oxide Substrates. United States: N. p., 2006. Web.
Thomas, George H, Morrell, Johathan, Aytug, Tolga, Xue, Ziling, & Beach, David B. Epitaxial Growth of Strontium Bismuth Tantalate/Niobate of Buffered Magnesium Oxide Substrates. United States.
Thomas, George H, Morrell, Johathan, Aytug, Tolga, Xue, Ziling, and Beach, David B. Sun . "Epitaxial Growth of Strontium Bismuth Tantalate/Niobate of Buffered Magnesium Oxide Substrates". United States. doi:.
@article{osti_1033963,
title = {Epitaxial Growth of Strontium Bismuth Tantalate/Niobate of Buffered Magnesium Oxide Substrates},
author = {Thomas, George H and Morrell, Johathan and Aytug, Tolga and Xue, Ziling and Beach, David B},
abstractNote = {Epitaxial films of strontium bismuth tantalate (SrBi{sub 2}Ta{sub 2}O{sub 9}, SBT) and strontium bismuth niobate (SrBi{sub 2}Nb{sub 2}O{sub 9}, SBN) were grown using solution deposition techniques on magnesium oxide (MgO) substrates buffered with a 100 nm layer of lanthanum manganate (LaMnO{sub 3}, LMO). Film structure and texture analyses were carried out using x-ray diffraction. Theta-2theta diffraction patterns were consistent with a c-axis aligned structure for both the buffer layer and the solution deposited films. Theta-2 theta scans revealed (001){sub SBT, SBN}//(001) LMO epitaxial relationships between the solution deposited films and the buffer layer. A pole figure about the SBT, SBN (115) reflection indicated a single in-plane epitaxy. Film quality was assessed using {omega} and {phi} scans. Nuclear Magnetic Resonance ({sup 13}C) was used to characterized the methoxy-ethoxide solutions used for the deposition of the SBN and SBT films.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Sun Jan 01 00:00:00 EST 2006},
month = {Sun Jan 01 00:00:00 EST 2006}
}

Conference:
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