Quantitative measurement of in-plane cantilever torsion for calibrating lateral piezoresponse force microscopy.

Journal Article · Sat Jan 01 00:00:00 EST 2011 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.3660806· OSTI ID:1033483

Choi, H; Hong, S; No, K ^[1]

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1. Materials Science Division

A simple quantitative measurement procedure of in-plane cantilever torsion for calibrating lateral piezoresponse force microscopy is presented. This technique enables one to determine the corresponding lateral inverse optical lever sensitivity (LIOLS) of the cantilever on the given sample. Piezoelectric coefficient, d{sub 31} of BaTiO{sub 3} single crystal (-81.62 {+-} 40.22 pm/V) which was calculated using the estimated LIOLS was in good agreement with the reported value in literature.

• Research Organization: Argonne National Lab. (ANL), Argonne, IL (United States)
• Sponsoring Organization: USDOE Office of Science (SC)
• DOE Contract Number: DE-AC02-06CH11357
• OSTI ID: 1033483
• Report Number(s): ANL/MSD/JA-70798; RSINAK; TRN: US201202%%789
• Journal Information: Review of Scientific Instruments, Vol. 82, Issue 11; ISSN 0034-6748
• Country of Publication: United States
• Language: ENGLISH

Related Subjects

47 OTHER INSTRUMENTATION
MICROSCOPY
MONOCRYSTALS
SENSITIVITY
TORSION