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Title: Carbon nanotube oscillator surface profiling device and method of use

Abstract

The proposed device is based on a carbon nanotube oscillator consisting of a finite length outer stationary nanotube and a finite length inner oscillating nanotube. Its main function is to measure changes in the characteristics of the motion of the carbon nanotube oscillating near a sample surface, and profile the roughness of this surface. The device operates in a non-contact mode, thus it can be virtually non-wear and non-fatigued system. It is an alternative to the existing atomic force microscope (AFM) tips used to scan surfaces to determine their roughness.

Inventors:
 [1];  [1];  [2]
  1. Tampa, FL
  2. Fuquay Varina, NC
Publication Date:
Research Org.:
University of South Florida (Tampa, FL)
Sponsoring Org.:
USDOE
OSTI Identifier:
1033113
Patent Number(s):
8,060,943
Application Number:
12/548,070
Assignee:
University of South Florida (Tampa, FL); North Carolina Central University (Durham, NC) CHO
DOE Contract Number:
FG02-06ER46297
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION

Citation Formats

Popescu, Adrian, Woods, Lilia M, and Bondarev, Igor V. Carbon nanotube oscillator surface profiling device and method of use. United States: N. p., 2011. Web.
Popescu, Adrian, Woods, Lilia M, & Bondarev, Igor V. Carbon nanotube oscillator surface profiling device and method of use. United States.
Popescu, Adrian, Woods, Lilia M, and Bondarev, Igor V. Tue . "Carbon nanotube oscillator surface profiling device and method of use". United States. doi:. https://www.osti.gov/servlets/purl/1033113.
@article{osti_1033113,
title = {Carbon nanotube oscillator surface profiling device and method of use},
author = {Popescu, Adrian and Woods, Lilia M and Bondarev, Igor V},
abstractNote = {The proposed device is based on a carbon nanotube oscillator consisting of a finite length outer stationary nanotube and a finite length inner oscillating nanotube. Its main function is to measure changes in the characteristics of the motion of the carbon nanotube oscillating near a sample surface, and profile the roughness of this surface. The device operates in a non-contact mode, thus it can be virtually non-wear and non-fatigued system. It is an alternative to the existing atomic force microscope (AFM) tips used to scan surfaces to determine their roughness.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Nov 15 00:00:00 EST 2011},
month = {Tue Nov 15 00:00:00 EST 2011}
}

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