Carbon nanotube oscillator surface profiling device and method of use

Popescu, Adrian; Woods, Lilia M; Bondarev, Igor V

Carbon nanotube oscillator surface profiling device and method of use

Patent · 14 November 2011

OSTI ID:1033113

Popescu, Adrian ^[1]; Woods, Lilia M ^[1]; Bondarev, Igor V ^[2]

Tampa, FL
Fuquay Varina, NC

The proposed device is based on a carbon nanotube oscillator consisting of a finite length outer stationary nanotube and a finite length inner oscillating nanotube. Its main function is to measure changes in the characteristics of the motion of the carbon nanotube oscillating near a sample surface, and profile the roughness of this surface. The device operates in a non-contact mode, thus it can be virtually non-wear and non-fatigued system. It is an alternative to the existing atomic force microscope (AFM) tips used to scan surfaces to determine their roughness.

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Research Organization:: University of South Florida (Tampa, FL)

Sponsoring Organization:: USDOE

DOE Contract Number:: FG02-06ER46297

Assignee:: University of South Florida (Tampa, FL); North Carolina Central University (Durham, NC)

Patent Number(s):: 8,060,943

Application Number:: 12/548,070

OSTI ID:: 1033113

Country of Publication:: United States

Language:: English

References (19)

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