Resolution theory and static- and frequency dependent cross-talk in piezoresponse force microscopy

Journal Article · Fri Jan 01 00:00:00 EST 2010 · Nanotechnology

DOI:https://doi.org/10.1088/0957-4484/21/40/405703· OSTI ID:1030997

Jesse, Stephen ^[1]; Guo, Senli ^[1]; Kumar, Amit ^[1]; Rodriguez, Brian ^[2]; Proksch, Roger ^[3]; Kalinin, Sergei V ^[1]

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1. ORNL
2. University College, Dublin
3. Asylum Research, Santa Barbara, CA

Probing materials functionality locally by scanning probe microscopy requires reliable framework for identifying the target signal and separating it from the effects of surface morphology and instrument non-idealities, i.e. instrumental and topographical cross-talk. Here we develop the linear resolution theory framework to describe the cross-talk effects, and apply it for elucidation of frequency dependent cross-talk mechanisms in the Piezoresponse Force Microscopy. The use of band excitation method allows electromechanical/electrical and mechanical/topographic signals to be unambiguously separated. The applicability of functional fit approach and multivariate statistical analysis methods for data identification in band excitation SPM is explored.

• Research Organization: Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)
• Sponsoring Organization: USDOE Laboratory Directed Research and Development (LDRD) Program
• DOE Contract Number: DE-AC05-00OR22725
• OSTI ID: 1030997
• Journal Information: Nanotechnology, Vol. 21, Issue 40; ISSN 0957-4484
• Country of Publication: United States
• Language: English

Related Subjects

77 NANOSCIENCE AND NANOTECHNOLOGY
EXCITATION
FUNCTIONALS
MICROSCOPY
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PROBES
RESOLUTION
TARGETS