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Title: Light Confinement-Induced Antireflection of ZnO Nanocones

Journal Article · · Applied Physics Letters
OSTI ID:1027836

The antireflective features of aperiodic vertical aligned ZnO nanocones on Si wafer were studied both experimentally and theoretically through comparison with planar ZnO films on Si substrates and bare Si substrates. The measured diffuse reflectance spectra show that the nanocone-based texture reduces the light reflection in a broad spectral range, and is much more effective than the planar textures. The numerical simulations exhibit a good agreement with the experimental data and suggest that the light confinement inside nanocones by controlling the diameters can bring further improvement of light absorption into Si.

Research Organization:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
DOE Contract Number:
DE-AC05-00OR22725
OSTI ID:
1027836
Journal Information:
Applied Physics Letters, Vol. 99, Issue 15; ISSN 0003-6951
Country of Publication:
United States
Language:
English