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Title: Light Confinement-Induced Antireflection of ZnO Nanocones

Abstract

The antireflective features of aperiodic vertical aligned ZnO nanocones on Si wafer were studied both experimentally and theoretically through comparison with planar ZnO films on Si substrates and bare Si substrates. The measured diffuse reflectance spectra show that the nanocone-based texture reduces the light reflection in a broad spectral range, and is much more effective than the planar textures. The numerical simulations exhibit a good agreement with the experimental data and suggest that the light confinement inside nanocones by controlling the diameters can bring further improvement of light absorption into Si.

Authors:
 [1];  [1];  [1];  [1]
  1. ORNL
Publication Date:
Research Org.:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1027836
DOE Contract Number:  
DE-AC05-00OR22725
Resource Type:
Journal Article
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Volume: 99; Journal Issue: 15; Journal ID: ISSN 0003-6951
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; ABSORPTION; CONFINEMENT; REFLECTION; SPECTRA; SUBSTRATES; TEXTURE

Citation Formats

Lee, Sang Hyun, Jellison, Jr, Gerald Earle, Duty, Chad E, and Xu, Jun. Light Confinement-Induced Antireflection of ZnO Nanocones. United States: N. p., 2011. Web.
Lee, Sang Hyun, Jellison, Jr, Gerald Earle, Duty, Chad E, & Xu, Jun. Light Confinement-Induced Antireflection of ZnO Nanocones. United States.
Lee, Sang Hyun, Jellison, Jr, Gerald Earle, Duty, Chad E, and Xu, Jun. Sat . "Light Confinement-Induced Antireflection of ZnO Nanocones". United States.
@article{osti_1027836,
title = {Light Confinement-Induced Antireflection of ZnO Nanocones},
author = {Lee, Sang Hyun and Jellison, Jr, Gerald Earle and Duty, Chad E and Xu, Jun},
abstractNote = {The antireflective features of aperiodic vertical aligned ZnO nanocones on Si wafer were studied both experimentally and theoretically through comparison with planar ZnO films on Si substrates and bare Si substrates. The measured diffuse reflectance spectra show that the nanocone-based texture reduces the light reflection in a broad spectral range, and is much more effective than the planar textures. The numerical simulations exhibit a good agreement with the experimental data and suggest that the light confinement inside nanocones by controlling the diameters can bring further improvement of light absorption into Si.},
doi = {},
url = {https://www.osti.gov/biblio/1027836}, journal = {Applied Physics Letters},
issn = {0003-6951},
number = 15,
volume = 99,
place = {United States},
year = {2011},
month = {1}
}