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Title: Ultrafast Diagnostics for Electron Beams from Laser Plasma Accelerators

Abstract

We present an overview of diagnostic techniques for measuring key parameters of electron bunches from Laser Plasma Accelerators (LPAs). The diagnostics presented here were chosen because they highlight the unique advantages (e.g., diverse forms of electromagnetic emission) and difficulties (e.g., shot-to-shot variability) associated with LPAs. Non destructiveness and high resolution (in space and time and energy) are key attributes that enable the formation of a comprehensive suite of simultaneous diagnostics which are necessary for the full characterization of the ultrashort, but highly-variable electron bunches from LPAs.

Authors:
; ; ; ; ; ; ; ; ; ; ; ; ;
Publication Date:
Research Org.:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Sponsoring Org.:
Accelerator& Fusion Research Division
OSTI Identifier:
1022732
Report Number(s):
LBNL-4647E
TRN: US1104476
DOE Contract Number:  
DE-AC02-05CH11231
Resource Type:
Conference
Resource Relation:
Conference: 2010 Advanced Accelerator Concepts Conference, Annapolis, MD, June 13 - 19, 2010
Country of Publication:
United States
Language:
English
Subject:
43; ACCELERATORS; DIAGNOSTIC TECHNIQUES; ELECTRON BEAMS; ELECTRONS; LASERS; PLASMA GUNS; RESOLUTION; THz, Wakefield, Laser, Plasma, Accelerator, Diagnostic

Citation Formats

Matlis, N. H., Bakeman, M., Geddes, C. G. R., Gonsalves, T., Lin, C., Nakamura, K., Osterhoff, J., Plateau, G. R., Schroeder, C. B., Shiraishi, S., Sokollik, T., van Tilborg, J., Toth, Cs., and Leemans, W. P. Ultrafast Diagnostics for Electron Beams from Laser Plasma Accelerators. United States: N. p., 2010. Web.
Matlis, N. H., Bakeman, M., Geddes, C. G. R., Gonsalves, T., Lin, C., Nakamura, K., Osterhoff, J., Plateau, G. R., Schroeder, C. B., Shiraishi, S., Sokollik, T., van Tilborg, J., Toth, Cs., & Leemans, W. P. Ultrafast Diagnostics for Electron Beams from Laser Plasma Accelerators. United States.
Matlis, N. H., Bakeman, M., Geddes, C. G. R., Gonsalves, T., Lin, C., Nakamura, K., Osterhoff, J., Plateau, G. R., Schroeder, C. B., Shiraishi, S., Sokollik, T., van Tilborg, J., Toth, Cs., and Leemans, W. P. Tue . "Ultrafast Diagnostics for Electron Beams from Laser Plasma Accelerators". United States. https://www.osti.gov/servlets/purl/1022732.
@article{osti_1022732,
title = {Ultrafast Diagnostics for Electron Beams from Laser Plasma Accelerators},
author = {Matlis, N. H. and Bakeman, M. and Geddes, C. G. R. and Gonsalves, T. and Lin, C. and Nakamura, K. and Osterhoff, J. and Plateau, G. R. and Schroeder, C. B. and Shiraishi, S. and Sokollik, T. and van Tilborg, J. and Toth, Cs. and Leemans, W. P.},
abstractNote = {We present an overview of diagnostic techniques for measuring key parameters of electron bunches from Laser Plasma Accelerators (LPAs). The diagnostics presented here were chosen because they highlight the unique advantages (e.g., diverse forms of electromagnetic emission) and difficulties (e.g., shot-to-shot variability) associated with LPAs. Non destructiveness and high resolution (in space and time and energy) are key attributes that enable the formation of a comprehensive suite of simultaneous diagnostics which are necessary for the full characterization of the ultrashort, but highly-variable electron bunches from LPAs.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2010},
month = {6}
}

Conference:
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