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Title: SEU and SEL response of the Westinghouse 64K E{sup 2}PROM, analog devices AD7876 12-bit ADC, and the Intel 82527 Serial Communications Controller

Conference ·
OSTI ID:10196794

The Westinghouse SA3823 64K E{sup 2}PROM radiation-hardened SONOS non-volatile memory exhibited a single-event-upset (SEU) threshold in the read mode of 60 MeV-cm{sup 2}/mg and 40 MeV-cm{sup 2}/mg for data latch errors. The minimum threshold for address latch errors was 35 MeV-cm{sup 2}/mg. Hard errors were observed with Kr at V{sub p} = 8.5 V and with Xe at Programming voltages (V{sub p}) as low as 7.5 V. NO hard errors were observed with Cu at any angle up to V{sub p} = II V. The system specification of no hard errors for Ar ions or lighter was exceeded. No single-event latchup (SEL) was observed in these devices for the conditions examined. The Analog Devices AD7876 12bit analog-to-digital converter (ADC) had an upset threshold of 2 MeV-cm{sup 2}/mg for all values of input voltage (V{sub in}), while the worst-case saturation cross section of {approximately}2 {times} 10{sup {minus}3} cm{sup 2} as measured with V{sub in} = 4.49 V. No latchup was observed. The Intel 82C527 serial communications controller exhibited a minimum threshold for upset of 2 MeV-cm{sup 4}/mLi, and a saturation cross section of about 5 {times} 10{sup {minus}4}cm{sup 2}. For latchup the minimum threshold was measured at 17 MeV-cm{sup 2}/mg, and cross section saturated at about 3 {times} 10{sup {minus}4} cm{sup 2}. Error rates for the expected applications are presented.

Research Organization:
Sandia National Labs., Albuquerque, NM (United States)
Sponsoring Organization:
USDOE, Washington, DC (United States)
DOE Contract Number:
AC04-94AL85000
OSTI ID:
10196794
Report Number(s):
SAND-94-0449C; CONF-940726-16; ON: DE95003349; BR: GB0103012
Resource Relation:
Conference: 31. annual international nuclear and space radiation effects conference,Tucson, AZ (United States),18-22 Jul 1994; Other Information: PBD: [1994]
Country of Publication:
United States
Language:
English