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Title: LLNL/Lion Precision LVDT amplifier

Abstract

A high-precision, low-noise, LVDT amplifier has been developed which is a significant advancement on the current state of the art in contact displacement measurement. This amplifier offers the dynamic range of a typical LVDT probe but with a resolution that rivals that of non contact displacement measuring systems such as capacitance gauges and laser interferometers. Resolution of 0.1 {mu} in with 100 Hz bandwidth is possible. This level of resolution is over an order of magnitude greater than what is now commercially available. A front panel switch can reduce the bandwidth to 2.5 Hz and attain a resolution of 0.025 {mu} in. This level of resolution meets or exceeds that of displacement measuring laser interferometry or capacitance gauge systems. Contact displacement measurement offers high part spatial resolution and therefore can measure not only part contour but surface finish. Capacitance gauges and displacement laser interferometry offer poor part spatial resolution and can not provide good surface finish measurements. Machine tool builders, meteorologists and quality inspection departments can immediately utilize the higher accuracy and capabilities that this amplifier offers. The precision manufacturing industry can improve as a result of improved capability to measure parts that help reduce costs and minimize material waste.

Authors:
Publication Date:
Research Org.:
Lawrence Livermore National Lab., CA (United States)
Sponsoring Org.:
USDOE, Washington, DC (United States)
OSTI Identifier:
10189724
Report Number(s):
UCRL-JC-116930; CONF-9404131-3
ON: DE95001504; CRN: C/LLNL--T-087-91-1; TRN: AHC29426%%59
DOE Contract Number:  
W-7405-ENG-48
Resource Type:
Conference
Resource Relation:
Conference: American Society for Precision Engineering (ASPE) conference,Tucson, AZ (United States),6-8 Apr 1994; Other Information: PBD: Apr 1994
Country of Publication:
United States
Language:
English
Subject:
42 ENGINEERING; MEASURING INSTRUMENTS; AMPLIFIERS; DISPLACEMENT GAGES; SPATIAL RESOLUTION; USES; 426000; COMPONENTS, ELECTRON DEVICES AND CIRCUITS

Citation Formats

Hopkins, D.J. LLNL/Lion Precision LVDT amplifier. United States: N. p., 1994. Web.
Hopkins, D.J. LLNL/Lion Precision LVDT amplifier. United States.
Hopkins, D.J. Fri . "LLNL/Lion Precision LVDT amplifier". United States. https://www.osti.gov/servlets/purl/10189724.
@article{osti_10189724,
title = {LLNL/Lion Precision LVDT amplifier},
author = {Hopkins, D.J.},
abstractNote = {A high-precision, low-noise, LVDT amplifier has been developed which is a significant advancement on the current state of the art in contact displacement measurement. This amplifier offers the dynamic range of a typical LVDT probe but with a resolution that rivals that of non contact displacement measuring systems such as capacitance gauges and laser interferometers. Resolution of 0.1 {mu} in with 100 Hz bandwidth is possible. This level of resolution is over an order of magnitude greater than what is now commercially available. A front panel switch can reduce the bandwidth to 2.5 Hz and attain a resolution of 0.025 {mu} in. This level of resolution meets or exceeds that of displacement measuring laser interferometry or capacitance gauge systems. Contact displacement measurement offers high part spatial resolution and therefore can measure not only part contour but surface finish. Capacitance gauges and displacement laser interferometry offer poor part spatial resolution and can not provide good surface finish measurements. Machine tool builders, meteorologists and quality inspection departments can immediately utilize the higher accuracy and capabilities that this amplifier offers. The precision manufacturing industry can improve as a result of improved capability to measure parts that help reduce costs and minimize material waste.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1994},
month = {4}
}

Conference:
Other availability
Please see Document Availability for additional information on obtaining the full-text document. Library patrons may search WorldCat to identify libraries that hold this conference proceeding.

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