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Title: Recombination and Metastability in Amorphous Silicon and Silicon-Germanium Alloys: Final Subcontract Report, 1 February 1991 - 31 January 1994

Technical Report ·
DOI:https://doi.org/10.2172/10169782· OSTI ID:10169782

Electroluminescence-spectra- and transient-current measurements were taken before and after light-soaking a-Si:H p-i-n structures. For the first time, we were able to distinguish between bulk- and junction-controlled recombination. We found that in buffered p-b-i-n structures, the main-band luminescence was more pronounced than that in simple p-i-n structures. The enhancement of the main-band luminescence relates with an increase of the open-circuit voltage. This is evidence that the recombination takes place near the p-i interface, and the quality of the p-i interface is very important in solar cell performance. We also found that for thick p-i-n cells ({ge}2 {mu}m), the luminescence contains more high-energy photons (1.1--1.2 eV) than does that for thin cells. Furthermore, the high-energy recombination is more efficient in creating metastable defects than is the low-energy recombination. Consequently, the thinner the i-layer, the less the light-induced effects. The results of repetition rate and reverse bias effects on forward-bias current imply that the junctions recover faster than the bulk when subjected to excess carriers caused by the bias. By including the coulomb interaction, we made progress on a microscopic model for radiative recombination.

Research Organization:
National Renewable Energy Lab. (NREL), Golden, CO (United States)
Sponsoring Organization:
USDOE Office of Energy Efficiency and Renewable Energy (EERE)
DOE Contract Number:
AC36-08GO28308
OSTI ID:
10169782
Report Number(s):
NREL/TP-451-6491; ON: DE94011837; BR: WM1020000
Resource Relation:
Other Information: PBD: Jul 1994
Country of Publication:
United States
Language:
English