Surfaces and thin films studied by picosecond ultrasonics. Progress report, December 1, 1989--November 30, 1992

Technical Report · Fri May 01 00:00:00 EDT 1992

DOI:https://doi.org/10.2172/10159108· OSTI ID:10159108

Maris, J H; Tauc, J

This research is the study of thin films and interfaces via the use of the picosecond ultrasonic technique. In these experiments ultrasonic waves are excited in a structure by means of a picosecond light pulse (``pump pulse``). The propagation of these waves is detected through the use of a probe light pulse that is time-delayed relative to the pump. This probe pulse measures the change {Delta}R(t) in the optical reflectivity of the structure that occurs because the ultrasonic wave changes the optical properties of the structure. This technique make possible the study of the attenuation and velocity of ultrasonic waves up to much higher frequencies than was previously possible (up to least 500 GHz). In addition, the excellent time-resolution of the method makes it possible to study nanostructures of linear dimensions down to 100 {Angstrom} or less by ultrasonic pulse-echo techniques. 25 refs.

• Research Organization: Brown Univ., Providence, RI (United States)
• Sponsoring Organization: USDOE, Washington, DC (United States)
• DOE Contract Number: FG02-86ER45267
• OSTI ID: 10159108
• Report Number(s): DOE/ER/45267-6; ON: DE92016313
• Resource Relation: Other Information: PBD: May 1992
• Country of Publication: United States
• Language: English

Related Subjects

42 ENGINEERING
47 OTHER INSTRUMENTATION
36 MATERIALS SCIENCE
THIN FILMS
ULTRASONIC TESTING
PROGRESS REPORT
ULTRASONIC WAVES
INTERFACES
REFLECTIVITY
ATTENUATION
TIME RESOLUTION
LASER RADIATION
AMORPHOUS STATE
HEAT FLOW
420500
440600
360104
360204
360606
MATERIALS TESTING
OPTICAL INSTRUMENTATION
PHYSICAL PROPERTIES