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Title: The application of maximum entropy to Z-contrast imaging in a stem

Abstract

Maximum entropy (Gull and Skilling, IEE Proceedings, 131F, 646 (1984)) is an image processing routine based on Bauesian probability which can produce a ``most likely`` image from original data given a particular point spread function. By combining maximum entropy and analysis with incoherent Z-contrast imaging, it is possible to retrieve crystal lattice information at atomic resolution from directly acquired experimental data without the need for preconceived structures. Results are given for simulated and experimentally acquired Z-contrast images of semiconductors (graded SiGe, <110> Si, <110> GaAs) at 300 kV.

Authors:
;
Publication Date:
Research Org.:
Oak Ridge National Lab., TN (United States)
Sponsoring Org.:
USDOE, Washington, DC (United States)
OSTI Identifier:
10148955
Report Number(s):
CONF-940766-2
ON: DE94011470
DOE Contract Number:  
AC05-84OR21400; AC05-76OR00033
Resource Type:
Conference
Resource Relation:
Conference: 13. international congress on electron microscopy,Paris (France),17-22 Jul 1994; Other Information: PBD: Mar 1994
Country of Publication:
United States
Language:
English
Subject:
37 INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; 36 MATERIALS SCIENCE; ELECTRON MICROSCOPY; IMAGE PROCESSING; SEMICONDUCTOR MATERIALS; STRUCTURAL CHEMICAL ANALYSIS; SILICON; GERMANIUM SILICIDES; GALLIUM ARSENIDES; 400101; 360602; ACTIVATION, NUCLEAR REACTION, RADIOMETRIC, AND RADIOCHEMICAL PROCEDURES; STRUCTURE AND PHASE STUDIES

Citation Formats

McGibbon, A.J., and Pennycook, S.J. The application of maximum entropy to Z-contrast imaging in a stem. United States: N. p., 1994. Web.
McGibbon, A.J., & Pennycook, S.J. The application of maximum entropy to Z-contrast imaging in a stem. United States.
McGibbon, A.J., and Pennycook, S.J. Tue . "The application of maximum entropy to Z-contrast imaging in a stem". United States. https://www.osti.gov/servlets/purl/10148955.
@article{osti_10148955,
title = {The application of maximum entropy to Z-contrast imaging in a stem},
author = {McGibbon, A.J. and Pennycook, S.J.},
abstractNote = {Maximum entropy (Gull and Skilling, IEE Proceedings, 131F, 646 (1984)) is an image processing routine based on Bauesian probability which can produce a ``most likely`` image from original data given a particular point spread function. By combining maximum entropy and analysis with incoherent Z-contrast imaging, it is possible to retrieve crystal lattice information at atomic resolution from directly acquired experimental data without the need for preconceived structures. Results are given for simulated and experimentally acquired Z-contrast images of semiconductors (graded SiGe, <110> Si, <110> GaAs) at 300 kV.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1994},
month = {3}
}

Conference:
Other availability
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