skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Patterned permalloy films for high frequency on chip circuit components.

Journal Article · · Eur. J. Sci. Res.
OSTI ID:1012812

No abstract prepared.

Research Organization:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Organization:
USDOE Office of Science (SC); Southern Illinois Univ.
DOE Contract Number:
DE-AC02-06CH11357
OSTI ID:
1012812
Report Number(s):
ANL/MSD/JA-69890; TRN: US201110%%321
Journal Information:
Eur. J. Sci. Res., Vol. 32, Issue 2 ; 2009
Country of Publication:
United States
Language:
ENGLISH

Similar Records

Direct current effects on high-frequency properties of patterned permalloy thin films.
Journal Article · Tue Dec 01 00:00:00 EST 2009 · IEEE Trans Mag. · OSTI ID:1012812

Tailoring high-frequency properties of permalloy films via submicron patterning.
Journal Article · Thu Jan 01 00:00:00 EST 2009 · IEEE Trans. Mag. · OSTI ID:1012812

Application of sub-micrometer patterned permalloy thin film in tunable radio frequency inductors
Journal Article · Tue Apr 21 00:00:00 EDT 2015 · Journal of Applied Physics · OSTI ID:1012812