Atomic scale structure and chemistry of interfaces by Z-contrast imaging and electron energy loss spectroscopy in the STEM
The macroscopic properties of many materials are controlled by the structure and chemistry at the grain boundaries. A basic understanding of the structure-property relationship requires a technique which probes both composition and chemical bonding on an atomic scale. The high-resolution Z-contrast imaging technique in the scanning transmission electron microscope (STEM) forms an incoherent image in which changes in atomic structure and composition can be interpreted intuitively. This direct image allows the electron probe to be positioned over individual atomic columns for parallel detection electron energy loss spectroscopy (PEELS) at a spatial resolution approaching 0.22nm. The bonding information which can be obtained from the fine structure within the PEELS edges can then be used in conjunction with the Z-contrast images to determine the structure at the grain boundary. In this paper we present 3 examples of correlations between the structural, chemical and electronic properties at materials interfaces in metal-semiconductor systems, superconducting and ferroelectric materials.
- Research Organization:
- Oak Ridge National Lab., TN (United States)
- Sponsoring Organization:
- USDOE, Washington, DC (United States)
- DOE Contract Number:
- AC05-84OR21400
- OSTI ID:
- 10122357
- Report Number(s):
- CONF-940412-4; ON: DE94006562
- Resource Relation:
- Conference: 39. international symposium of the Society for the Advancement of Material and Process Engineering and exhibition,Anaheim, CA (United States),11-14 Apr 1994; Other Information: PBD: Dec 1993
- Country of Publication:
- United States
- Language:
- English
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Atomic-scale structure and chemistry of interfaces by Z-contrast imaging and electron energy loss spectroscopy in the STEM
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Related Subjects
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
36 MATERIALS SCIENCE
INTERFACES
STRUCTURAL CHEMICAL ANALYSIS
GRAIN BOUNDARIES
MICROANALYSIS
SCANNING ELECTRON MICROSCOPY
ENERGY-LOSS SPECTROSCOPY
TRANSMISSION ELECTRON MICROSCOPY
IMAGES
HIGH-TC SUPERCONDUCTORS
STRONTIUM TITANATES
BICRYSTALS
COBALT SILICIDES
SILICON
400101
360000
ACTIVATION, NUCLEAR REACTION, RADIOMETRIC, AND RADIOCHEMICAL PROCEDURES
MATERIALS