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Title: Femtosecond X-ray generation through 90{sup o} Thomson scattering: Status of the LBL experiment

Conference ·
OSTI ID:10118189

Scattering of femotosecond laser pulses off a low energy relativistic electron beam at 90{sup o} offers the possibility to generate ultrashort X-ray pulses. Experiments are under preparation in the Beam Test Facility of the Center for Beam Physics at LBL to demonstrate the generation and detection of such pulses. The experiments involve a relativistic electron beam (tunable from 25-50 MeV) with a bunch length of 10 ps containing 1-2 nC, and an ultra short pulse (50-200 fs), high peak power (>2 TW) 0.8 {mu}m Ti:Al{sub 2}O{sub 3} laser system. The electron beam, focused down to about a 50 {mu}m waist size intersects the focused laser beam at 90{sup o}. The laser field acts as an electromagnetic undulator with strength K (quiver velocity of an electron normalized to the speed of light) for the relativistic electron beam, generating radiation up-shifted by 2{gamma}{sup 2}/(1+K{sup 2}/2) and a pulse length given by the overlapped interaction length in time of the laser beam and the electron beam. Here {gamma} is the usual Lorentz factor. Wavelength tuning will be accomplished in the experiment by generating wiggler strengths on the order of one as well as by electron beam energy tuning. For a 50 MeV electron beam and a laser beam focused to an intensity on the order of 10{sup 16} W/cm{sup 2}, the authors expect 10{sup 5} photons at 0.4 {angstrom} (10% bandwidth) in a cone angle of 6 mrad in a 170 fs pulse.

Research Organization:
Lawrence Berkeley Lab., CA (US); Advanced Light Source (US)
Sponsoring Organization:
USDOE, Washington, DC (US)
DOE Contract Number:
AC03-76SF00098
OSTI ID:
10118189
Report Number(s):
LBL-36369; CBP-107; CONF-940681-9; LBNL/ALS-733; ON: DE95006560; TRN: US200305%%1152
Resource Relation:
Conference: 6. advanced accelerator concepts workshop, Fontana, WI (US), 06/13/1994--06/18/1994; Other Information: Supercedes report DE95006560; PBD: Nov 1994; PBD: 1 Nov 1994
Country of Publication:
United States
Language:
English