Optical XAFS of ZnO Nanowires at the Zn K-Edge and Related Phenomena
Conference
·
OSTI ID:1009007
- APS
We report x-ray excited optical luminescence (XEOL) from one-dimensional nanostructures of ZnO excited with photon energies across the Zn K-edge. The optical luminescence shows an UV and a green emission band characteristic of near band edge and defect emission, respectively. The optical channels were used in turn to monitor the Zn K-edge XAFS to high k values. The densities of states of oxygen character in the valence band were also studied with x-ray emission spectroscopy (XES). The Zn K-edge decay dynamics was examined with time-resolved x-ray excited optical luminescence.
- Research Organization:
- Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
- Sponsoring Organization:
- USDOE
- OSTI ID:
- 1009007
- Resource Relation:
- Conference: 13th International Conference on X-ray Absorption Fine Structure-XAFS13;9-14 July 2006;Stanford, California, USA
- Country of Publication:
- United States
- Language:
- ENGLISH
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