On the refinement of time-resolved diffraction data: comparison of the random-distribution and cluster-formation models and analysis of the light-induced increase in the atomic displacement parameters

Journal Article · Tue Jul 20 00:00:00 EDT 2010 · J. Synchrotron Rad.

OSTI ID:1008631

Vorontsov, Ivan I; Coppens, Philip ^[1]

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1. SUNYB

Expressions for the random-distribution and cluster-formation models for light-induced changes in crystals studied by time-resolved diffraction are presented. The two models can be distinguished on the basis of differences in the predicted intensities. The light-induced increase in the atomic displacement parameters is analyzed with both simulated and experimental data sets.

• Research Organization: Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
• Sponsoring Organization: USDOE
• OSTI ID: 1008631
• Journal Information: J. Synchrotron Rad., Vol. 12, Issue (4) ; 2005; ISSN 0909-0495
• Country of Publication: United States
• Language: ENGLISH

Related Subjects

43 PARTICLE ACCELERATORS
ATOMIC DISPLACEMENTS
DIFFRACTION
SYNCHROTRON RADIATION