Focusing of hard x-rays to 16 manometers with a multilayer Laue lens.
- Center for Nanoscale Materials
We report improved results for hard x-ray focusing using a multilayer Laue lens (MLL). We have measured a line focus of 16 nm width with an efficiency of 31% at a wavelength {lambda} = 0.064 nm (19.5 keV) using a partial MLL structure with an outermost zone width of 5 nm. The results are in good agreement with the theoretically predicted performance.
- Research Organization:
- Argonne National Lab. (ANL), Argonne, IL (United States)
- Sponsoring Organization:
- Korean Research Foundation Grants
- DOE Contract Number:
- DE-AC02-06CH11357
- OSTI ID:
- 1008267
- Report Number(s):
- ANL/MSD/JA-60090; TRN: US201106%%362
- Journal Information:
- Appl. Phys. Lett., Vol. 92, Issue Jun. 2008
- Country of Publication:
- United States
- Language:
- ENGLISH
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