Piezoresponse Force Microscopy and Recent Advances in Nanoscale Studies of Ferroelectrics

Journal Article · Sun Jan 01 00:00:00 EST 2006 · Journal of Materials Science

DOI:https://doi.org/10.1007/s10853-005-5946-0· OSTI ID:1003503

Gruverman, A. ^[1]; Kalinin, Sergei V ^[2]

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1. North Carolina State University
2. ORNL

In this paper, we review recent advances in piezoresponse force microscopy (PFM) with respect to nanoscale ferroelectric research, summarize the basic principles of PFM, illustrate what information can be obtained from PFM experiments and delineate the limitations of PFM signal interpretation relevant to quantitative imaging of a broad range of piezoelectrically active materials. Particular attention is given to orientational PFM imaging and data interpretation as well as to electromechanics and kinetics of nanoscale ferroelectric switching in PFM.

• Research Organization: Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
• Sponsoring Organization: USDOE Laboratory Directed Research and Development (LDRD) Program
• DOE Contract Number: DE-AC05-00OR22725
• OSTI ID: 1003503
• Journal Information: Journal of Materials Science, Vol. 41, Issue 1; ISSN 0022--2461
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
77 NANOSCIENCE AND NANOTECHNOLOGY
FERROELECTRIC MATERIALS
NANOSTRUCTURES
PIEZOELECTRICITY
MICROSCOPY
PERFORMANCE