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Title: Solution deposition approach to high Jc coated conductor fabrication

Abstract

Great strides have been made in YBCO coated conductor fabrication using the RABiTS approach in the past few years and critical current densities (J{sub c}) of over 3 MA/cm{sup 2} on 10 meter long tapes have been achieved. Solution deposition for buffer layer processing has the potential to reduce the process complexity and make the conductor fabrication more cost-effective. In our work, we have demonstrated that several of the standard buffer layers can be replaced by sol-gel processed lanthanum zirconium oxide (LZO) layer. A J{sub c} of about 2 MA/cm{sup 2} has been demonstrated on LZO films for pulsed laser deposited YBCO and J{sub c} up to 1.5 MA/cm{sup 2} have been demonstrated for MOD-YBCO using a sputtered CeO{sub 2} cap layer on the sol-gel LZO films. Solution processed buffer layers have been found to have rapid growth kinetics which could potentially mean high rate processing of these buffer layers. Using simulated ex-situ YBCO annealing studies, it has been determined that the performance of 80-120 nm thick LZO films is comparable to the standard 3-layer vapor deposited CeO{sub 2}/YSZ/Y{sub 2}O{sub 3} buffer stack. Using a 120 nm thick LZO layers on NiW substrates, in collaboration with American Superconductor Corp., all-solutionmore » coated conductors with the stacking sequence MOD-YBCO/Solution CeO{sub 2}/Solution LZO/NiW, critical currents of up to 140 A/cm has been measured. Such high critical currents on an all-solution conductor offers promise for cost-effective scale-up of coated conductor processing.« less

Authors:
 [1];  [1];  [1];  [1];  [1];  [1];  [2];  [2];  [2];  [2]
  1. ORNL
  2. American Superconductor Corporation, Westborough, MA
Publication Date:
Research Org.:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Org.:
OE USDOE - Office of Electric Transmission and Distribution; USDOE Office of Energy Efficiency and Renewable Energy (EERE)
OSTI Identifier:
1003278
DOE Contract Number:  
DE-AC05-00OR22725
Resource Type:
Journal Article
Journal Name:
IEEE Transactions on Applied Superconductivity
Additional Journal Information:
Journal Volume: 15; Journal Issue: 2; Journal ID: ISSN 1051--8223
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ANNEALING; BUFFERS; CRITICAL CURRENT; DEPOSITION; FABRICATION; KINETICS; LANTHANUM; LASERS; METERS; PERFORMANCE; PROCESSING; SUBSTRATES; SUPERCONDUCTORS; ZIRCONIUM OXIDES

Citation Formats

Sathyamurthy, Srivatsan, Paranthaman, Mariappan Parans, Bhuiyan, Md S, Payzant, E Andrew, Lee, Dominic F, Goyal, Amit, Li, Xiaoping, Kodenkandath, Thomas, Schoop, U., and Rupich, Marty. Solution deposition approach to high Jc coated conductor fabrication. United States: N. p., 2005. Web. doi:10.1109/TASC.2005.848688.
Sathyamurthy, Srivatsan, Paranthaman, Mariappan Parans, Bhuiyan, Md S, Payzant, E Andrew, Lee, Dominic F, Goyal, Amit, Li, Xiaoping, Kodenkandath, Thomas, Schoop, U., & Rupich, Marty. Solution deposition approach to high Jc coated conductor fabrication. United States. https://doi.org/10.1109/TASC.2005.848688
Sathyamurthy, Srivatsan, Paranthaman, Mariappan Parans, Bhuiyan, Md S, Payzant, E Andrew, Lee, Dominic F, Goyal, Amit, Li, Xiaoping, Kodenkandath, Thomas, Schoop, U., and Rupich, Marty. 2005. "Solution deposition approach to high Jc coated conductor fabrication". United States. https://doi.org/10.1109/TASC.2005.848688.
@article{osti_1003278,
title = {Solution deposition approach to high Jc coated conductor fabrication},
author = {Sathyamurthy, Srivatsan and Paranthaman, Mariappan Parans and Bhuiyan, Md S and Payzant, E Andrew and Lee, Dominic F and Goyal, Amit and Li, Xiaoping and Kodenkandath, Thomas and Schoop, U. and Rupich, Marty},
abstractNote = {Great strides have been made in YBCO coated conductor fabrication using the RABiTS approach in the past few years and critical current densities (J{sub c}) of over 3 MA/cm{sup 2} on 10 meter long tapes have been achieved. Solution deposition for buffer layer processing has the potential to reduce the process complexity and make the conductor fabrication more cost-effective. In our work, we have demonstrated that several of the standard buffer layers can be replaced by sol-gel processed lanthanum zirconium oxide (LZO) layer. A J{sub c} of about 2 MA/cm{sup 2} has been demonstrated on LZO films for pulsed laser deposited YBCO and J{sub c} up to 1.5 MA/cm{sup 2} have been demonstrated for MOD-YBCO using a sputtered CeO{sub 2} cap layer on the sol-gel LZO films. Solution processed buffer layers have been found to have rapid growth kinetics which could potentially mean high rate processing of these buffer layers. Using simulated ex-situ YBCO annealing studies, it has been determined that the performance of 80-120 nm thick LZO films is comparable to the standard 3-layer vapor deposited CeO{sub 2}/YSZ/Y{sub 2}O{sub 3} buffer stack. Using a 120 nm thick LZO layers on NiW substrates, in collaboration with American Superconductor Corp., all-solution coated conductors with the stacking sequence MOD-YBCO/Solution CeO{sub 2}/Solution LZO/NiW, critical currents of up to 140 A/cm has been measured. Such high critical currents on an all-solution conductor offers promise for cost-effective scale-up of coated conductor processing.},
doi = {10.1109/TASC.2005.848688},
url = {https://www.osti.gov/biblio/1003278}, journal = {IEEE Transactions on Applied Superconductivity},
issn = {1051--8223},
number = 2,
volume = 15,
place = {United States},
year = {Sat Jan 01 00:00:00 EST 2005},
month = {Sat Jan 01 00:00:00 EST 2005}
}