Solute distribution in nanocrystalline Ni-W alloys examined through atom probe tomography
Abstract
Atom probe tomography is used to observe the solute distribution in electrodeposited nanocrystalline Ni-W alloys with three different grain sizes (3, 10 and 20 nm) and the results are compared with atomistic computer simulations. The presence of grain boundary segregation is confirmed by detailed analysis of composition fluctuations in both experimental and simulated structures, and its extent quantified by a frequency distribution analysis. In contrast to other nanocrystalline alloys previously examined by atom probe tomography, such as Ni-P, the present nanocrystalline Ni-W alloys exhibit only a subtle amount of solute segregation to the intergranular regions.
- Authors:
-
- Massachusetts Institute of Technology (MIT)
- ORNL
- Publication Date:
- Research Org.:
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Shared Research Equipment Collaborative Research Center
- Sponsoring Org.:
- USDOE Office of Science (SC)
- OSTI Identifier:
- 1003245
- DOE Contract Number:
- DE-AC05-00OR22725
- Resource Type:
- Journal Article
- Journal Name:
- Philosophical Magazine
- Additional Journal Information:
- Journal Volume: 86; Journal Issue: 28; Journal ID: ISSN 1478--6435
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE; 99 GENERAL AND MISCELLANEOUS//MATHEMATICS, COMPUTING, AND INFORMATION SCIENCE; ALLOYS; ATOMS; COMPUTERIZED SIMULATION; DISTRIBUTION; FLUCTUATIONS; GRAIN SIZE; NICKEL ALLOYS; SEGREGATION; SOLUTES; TOMOGRAPHY; TUNGSTEN ALLOYS
Citation Formats
Detor, Andrew J., Miller, Michael K, and Schuh, Christopher A. Solute distribution in nanocrystalline Ni-W alloys examined through atom probe tomography. United States: N. p., 2006.
Web. doi:10.1080/14786430600726749.
Detor, Andrew J., Miller, Michael K, & Schuh, Christopher A. Solute distribution in nanocrystalline Ni-W alloys examined through atom probe tomography. United States. https://doi.org/10.1080/14786430600726749
Detor, Andrew J., Miller, Michael K, and Schuh, Christopher A. 2006.
"Solute distribution in nanocrystalline Ni-W alloys examined through atom probe tomography". United States. https://doi.org/10.1080/14786430600726749.
@article{osti_1003245,
title = {Solute distribution in nanocrystalline Ni-W alloys examined through atom probe tomography},
author = {Detor, Andrew J. and Miller, Michael K and Schuh, Christopher A.},
abstractNote = {Atom probe tomography is used to observe the solute distribution in electrodeposited nanocrystalline Ni-W alloys with three different grain sizes (3, 10 and 20 nm) and the results are compared with atomistic computer simulations. The presence of grain boundary segregation is confirmed by detailed analysis of composition fluctuations in both experimental and simulated structures, and its extent quantified by a frequency distribution analysis. In contrast to other nanocrystalline alloys previously examined by atom probe tomography, such as Ni-P, the present nanocrystalline Ni-W alloys exhibit only a subtle amount of solute segregation to the intergranular regions.},
doi = {10.1080/14786430600726749},
url = {https://www.osti.gov/biblio/1003245},
journal = {Philosophical Magazine},
issn = {1478--6435},
number = 28,
volume = 86,
place = {United States},
year = {Sun Jan 01 00:00:00 EST 2006},
month = {Sun Jan 01 00:00:00 EST 2006}
}
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