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Title: Solute distribution in nanocrystalline Ni-W alloys examined through atom probe tomography

Abstract

Atom probe tomography is used to observe the solute distribution in electrodeposited nanocrystalline Ni-W alloys with three different grain sizes (3, 10 and 20 nm) and the results are compared with atomistic computer simulations. The presence of grain boundary segregation is confirmed by detailed analysis of composition fluctuations in both experimental and simulated structures, and its extent quantified by a frequency distribution analysis. In contrast to other nanocrystalline alloys previously examined by atom probe tomography, such as Ni-P, the present nanocrystalline Ni-W alloys exhibit only a subtle amount of solute segregation to the intergranular regions.

Authors:
 [1];  [2];  [1]
  1. Massachusetts Institute of Technology (MIT)
  2. ORNL
Publication Date:
Research Org.:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States); Shared Research Equipment Collaborative Research Center
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
1003245
DOE Contract Number:
DE-AC05-00OR22725
Resource Type:
Journal Article
Resource Relation:
Journal Name: Philosophical Magazine; Journal Volume: 86; Journal Issue: 28
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 99 GENERAL AND MISCELLANEOUS//MATHEMATICS, COMPUTING, AND INFORMATION SCIENCE; ALLOYS; ATOMS; COMPUTERIZED SIMULATION; DISTRIBUTION; FLUCTUATIONS; GRAIN SIZE; NICKEL ALLOYS; SEGREGATION; SOLUTES; TOMOGRAPHY; TUNGSTEN ALLOYS

Citation Formats

Detor, Andrew J., Miller, Michael K, and Schuh, Christopher A.. Solute distribution in nanocrystalline Ni-W alloys examined through atom probe tomography. United States: N. p., 2006. Web. doi:10.1080/14786430600726749.
Detor, Andrew J., Miller, Michael K, & Schuh, Christopher A.. Solute distribution in nanocrystalline Ni-W alloys examined through atom probe tomography. United States. doi:10.1080/14786430600726749.
Detor, Andrew J., Miller, Michael K, and Schuh, Christopher A.. Sun . "Solute distribution in nanocrystalline Ni-W alloys examined through atom probe tomography". United States. doi:10.1080/14786430600726749.
@article{osti_1003245,
title = {Solute distribution in nanocrystalline Ni-W alloys examined through atom probe tomography},
author = {Detor, Andrew J. and Miller, Michael K and Schuh, Christopher A.},
abstractNote = {Atom probe tomography is used to observe the solute distribution in electrodeposited nanocrystalline Ni-W alloys with three different grain sizes (3, 10 and 20 nm) and the results are compared with atomistic computer simulations. The presence of grain boundary segregation is confirmed by detailed analysis of composition fluctuations in both experimental and simulated structures, and its extent quantified by a frequency distribution analysis. In contrast to other nanocrystalline alloys previously examined by atom probe tomography, such as Ni-P, the present nanocrystalline Ni-W alloys exhibit only a subtle amount of solute segregation to the intergranular regions.},
doi = {10.1080/14786430600726749},
journal = {Philosophical Magazine},
number = 28,
volume = 86,
place = {United States},
year = {Sun Jan 01 00:00:00 EST 2006},
month = {Sun Jan 01 00:00:00 EST 2006}
}