1-to 10-keV x-ray backlighting of annular wire arrays on the Sandia Z-machine using bent-crystal imaging techniques.

Conference · Tue Jul 01 00:00:00 EDT 2003

OSTI ID:1002113

Rambo, Patrick K; Wenger, David Franklin; Bennett, Guy R; Sinars, Daniel Brian; Smith, Ian Craig; Cuneo, Michael Edward; Rovang, Dean Curtis; Anderson, Jessica E

Annular wire array implosions on the Sandia Z-machine can produce >200 TW and 1-2 MJ of soft x rays in the 0.1-10 keV range. The x-ray flux and debris in this environment present significant challenges for radiographic diagnostics. X-ray backlighting diagnostics at 1865 and 6181 eV using spherically-bent crystals have been fielded on the Z-machine, each with a {approx}0.6 eVspectral bandpass, 10 {micro}m spatial resolution, and a 4 mm by 20mm field of view. The Z-Beamlet laser, a 2-TW, 2-kJ Nd:glass laser({lambda} = 527 nm), is used to produce 0.1-1 J x-ray sources for radiography. The design, calibration, and performance of these diagnostics is presented.

• Research Organization: Sandia National Laboratories (SNL), Albuquerque, NM, and Livermore, CA (United States)
• Sponsoring Organization: USDOE
• DOE Contract Number: AC04-94AL85000
• OSTI ID: 1002113
• Report Number(s): SAND2003-2625C; TRN: US1100460
• Resource Relation: Conference: Proposed for presentation as an invited talk at the SPIE International Symposium - 48th Annual Meeting held August 3-8, 2003 in San Diego, CA.
• Country of Publication: United States
• Language: English

Related Subjects

70 PLASMA PHYSICS AND FUSION TECHNOLOGY
LINEAR Z PINCH DEVICES
WIRES
IMPLOSIONS
DIAGNOSTIC TECHNIQUES
CALIBRATION
DESIGN
KEV RANGE
PERFORMANCE
SPATIAL RESOLUTION
X-RAY SOURCES