Probing interfacial electronic structures in atomic layer LaMnO{sub3} and SrTiO{sub 3} superlattices.
The interfacial electronic structure characterization of a m x (LaMnO{sub 3})/n x (SrTiO{sub 3}) superlattice based on scanning transmission electron microscopy and electron energy loss spectroscopy. Evidence of interfacial band alignment and electron transfer are presented based on the observation of O K edge of individual transition metal and oxygen atomic columns. Electron probe aberration correction was essential for the high spatial resolution mapping of interfacial electronic states.
- Research Organization:
- Argonne National Lab. (ANL), Argonne, IL (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC)
- DOE Contract Number:
- DE-AC02-06CH11357
- OSTI ID:
- 1000661
- Report Number(s):
- ANL/MSD/JA-68505; TRN: US201101%%445
- Journal Information:
- Adv. Mater., Vol. 22, Issue 2010
- Country of Publication:
- United States
- Language:
- ENGLISH
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