Improving flux pinning in YBa[sub 2]Cu[sub 3]O[sub 7] coated conductors by changing the buffer layer deposition conditions
- Boris Alfredo
- Haiyan
- Stephen R.
- Paul N.
- Leonardo
We present a comparative study of the flux pinning properties of YBa{sub 2}Cu{sub 3}O{sub 7} films deposited by pulsed laser deposition on polycrystalline metal substrates with a biaxially oriented MgO template produced by ion-beam-assisted deposition (IBAD), varying the deposition temperature (T{sub STO}) for the SrTiO{sub 3} buffer layer. We find that when T{sub STO} = T*{sub STO} = 820 C, the critical current density at self-field (J{sub c}{sup sf}) is maximized and the surface roughness minimized. On the contrary, in-field critical current density (J{sub c}) measurements show that at high fields, samples with T{sub STO} <T*{sub STO} present higher J{sub c}. Angular-dependent J{sub c} measurements show that this improvement is due to the presence of additional extended parallel defects (in particular, thread dislocations), which produce a peak in J{sub c} centered in the c-axis direction. We use the field dependence of the height and the width of this peak to compare the density of the correlated defects in samples prepared with different T{sub STO}.
- Research Organization:
- Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
- Sponsoring Organization:
- USDOE
- OSTI ID:
- 977533
- Report Number(s):
- LA-UR-04-2227; TRN: US201009%%826
- Resource Relation:
- Conference: Submitted to 106th American Ceramic Society Meeting, Indianpolis, IN, April 14-21, 2004
- Country of Publication:
- United States
- Language:
- English
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