Microstructural development and control in YBa[sub 2]Cu[sub 3]O[sub y]

Conference · Mon Jan 01 00:00:00 EST 2001

OSTI ID:975815

Holesinger, T G ^[1]; Gibbons, B J ^[2]; Foltyn, S R ^[3]; Arendt, P N ^[4]; Groves, J R ^[5]; Coulter, J Y ^[6]

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1. Terry G.
2. Brady J.
3. Stephen R.
4. Paul N.
5. James R.
6. James Y.

A study of some defect structures in Y{sub 1}Ba{sub 2}Cu{sub 3}O{sub 7} (Y-123)coated conductors based on ion-beam -assisted-deposition (IBAD) of yttria-stabilized zirconia (YSZ) on nickel alloy substrates is presented. Defect structures can originate anywhere in the coated conductor architecture. Defects can be additive and propagate through the entire film structure to affect the growth, orientation, arid properties of the superconducting film. Interfacial Ieactions between Y- 123 and the underlying buffer layer and the corresponding effects on the transport properticis of the films can be controlled with the thickness of the underlying buffer layer. With a 9Ow ceria buffer layer on an IBAD YSZ coated metal substrate, a J, value of 1.7 MA/cm{sup 2} (self-field, 75K) was obtained in a 1.5{micro}m thick Y-123 film.

• Research Organization: Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
• Sponsoring Organization: USDOE
• OSTI ID: 975815
• Report Number(s): LA-UR-01-5680; TRN: US201018%%901
• Resource Relation: Conference: "Submitted to: Advances in Cryogenic Engineering, Volume 47 and 48, Proceedings of the Joint CEC/ICMC Conference, Madison, WI, July 16-20, 2001"
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ADDITIVES
ARCHITECTURE
BUFFERS
CRYOGENICS
DEFECTS
NICKEL ALLOYS
ORIENTATION
SUBSTRATES
SUPERCONDUCTING FILMS
THICKNESS
TRANSPORT