TIME-RESOLVED X-RAY DIFFRACTION MEASUREMENTS ON SHOCKED LIF CRYSTALS
- Paulo A.
- Kurt A.
- Yogendra M.
Time-resolved x-ra:y diffraction measurements were carried out on shock-compressed LiF single crystals in plate impact experiments for the first time. Data (2-4 ns resolution) were obtained using an x-ray streak camera firom crystals subjected to both shock and ramp wave loading along the [111] direction. Because of the penetration depth of the x-rays into the sample, interpretation of the ramp wave loading data required an analytic model to simulate the results. The penetration depth used in this model was determined experimentally from the time-resolved shock wave loading data. Good agreement between the simulations and experimental data was found for both loading conditions, suggesting that the analytic model has broad applicability. Analytic developments and the implications of our results will be discussed.
- Research Organization:
- Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
- Sponsoring Organization:
- USDOE
- OSTI ID:
- 975574
- Report Number(s):
- LA-UR-01-3363; TRN: US201018%%762
- Resource Relation:
- Conference: Submitted to: Shock Compression of Condensed Matter--2001: Proceedings of the Conference of the APS Topical Group on Shock Compression of Condensed Matter held at Atlanta, GA, June 2001.
- Country of Publication:
- United States
- Language:
- English
Similar Records
Modeling of time resolved x-ray diffraction from laser-shocked crystals
Multiple x-ray diffraction to determine transverse and longitudinal lattice deformation in shocked lithium fluoride