Measurement Of Transverse Jc Profiles Of Coated Conductors Using A Magnetic Knife Of Permanent Magnets
- Los Alamos National Laboratory
The transverse J{sub c} distribution in YBCO coated conductors was measured nondestructively with high resolution using a 'magnetic knife' made of permanent magnets. The method utilizes the strong depression of J{sub c} in applied magnetic fields. A narrow region of low (including zero) magnetic field, in a surrounding higher field, is moved transversely across the sample in order to reveal the critical-current density distribution. The net resolution of this device is approximately 65 {mu}m, and the J{sub c} resolution is better than 0.5%. A Fourier series inversion process was used to determine the transverse J{sub c} distribution in the sample. The J{sub c} profile was correlated with other sample properties of coated conductors prepared by pulsed laser deposition. Because of its straight-forward and inexpensive design, this J{sub c} imaging technique can be a powerful tool for quality control in coated-conductor production.
- Research Organization:
- Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- AC52-06NA25396
- OSTI ID:
- 956592
- Report Number(s):
- LA-UR-08-04381; LA-UR-08-4381; APPLAB; TRN: US201014%%1961
- Journal Information:
- Applied Physics Letters, Journal Name: Applied Physics Letters; ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
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