Investigation of Charge Transport Properties of CdZnTe Detectors with Synchrotron X-ray Radiation
Various internal defects, such as Te inclusions, twin boundaries, dislocation, etc., are prevalent in as-grown CdZnTe (CZT) crystals, which affect the charge transport properties of CZT crystals and, therefore, worsen the performance of CZT detectors. In order to develop high quality CZT detectors, it is imperative to clarify the effects of internal defects on the charge transport properties of CZT. Simple flood illumination with nuclear radiation source cannot reveal the nature of highly localized defects in CZT. Therefore, at Brookhaven's National Synchrotron Light Source (NSLS), we have developed a unique testing system for micro-scale defect investigation of CZT, which employs an X-ray beam collimated with the spatial resolution as small as 3 x 3 {micro}m{sup 2}, a microscopic size comparable to the scale of common defects in CZT. This powerful tool enables us to investigate the effect of internal defects on charge transport properties of CZT in detail.
- Research Organization:
- Brookhaven National Lab. (BNL), Upton, NY (United States)
- Sponsoring Organization:
- Doe - National Nuclear Security Administration
- DOE Contract Number:
- DE-AC02-98CH10886
- OSTI ID:
- 942251
- Report Number(s):
- BNL-81713-2008-CP; R&D Project: 10406; NN2001000; TRN: US0900385
- Resource Relation:
- Conference: IEEE Dresden 2008 - Poster; Dresden, Germany; 20081019 through 20081025
- Country of Publication:
- United States
- Language:
- English
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